Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer

De Wei Huang, Hsueh Pin Lin, Dung-Ching Perng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×10 4 %. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×10 2 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R 380nm /R 450nm ) of more than 10 2 . The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.

Original languageEnglish
Title of host publicationTechConnect Briefs 2018 - Informatics, Electronics and Microsystems
EditorsMatthew Laudon, Fiona Case, Bart Romanowicz, Fiona Case
PublisherTechConnect
Pages213-216
Number of pages4
ISBN (Electronic)9780998878256
Publication statusPublished - 2018 Jan 1
Event11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference - Anaheim, United States
Duration: 2018 May 132018 May 16

Publication series

NameTechConnect Briefs 2018 - Advanced Materials
Volume4

Other

Other11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference
CountryUnited States
CityAnaheim
Period18-05-1318-05-16

Fingerprint

Photodetectors
Nanorods
Thin films
Dark currents
Buffer layers
Quantum efficiency
poly-N-vinylcarbazole
Lighting
Costs

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

Cite this

Huang, D. W., Lin, H. P., & Perng, D-C. (2018). Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. In M. Laudon, F. Case, B. Romanowicz, & F. Case (Eds.), TechConnect Briefs 2018 - Informatics, Electronics and Microsystems (pp. 213-216). (TechConnect Briefs 2018 - Advanced Materials; Vol. 4). TechConnect.
Huang, De Wei ; Lin, Hsueh Pin ; Perng, Dung-Ching. / Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. editor / Matthew Laudon ; Fiona Case ; Bart Romanowicz ; Fiona Case. TechConnect, 2018. pp. 213-216 (TechConnect Briefs 2018 - Advanced Materials).
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abstract = "This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×10 4 {\%}. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×10 2 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R 380nm /R 450nm ) of more than 10 2 . The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.",
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Huang, DW, Lin, HP & Perng, D-C 2018, Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. in M Laudon, F Case, B Romanowicz & F Case (eds), TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. TechConnect Briefs 2018 - Advanced Materials, vol. 4, TechConnect, pp. 213-216, 11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference, Anaheim, United States, 18-05-13.

Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. / Huang, De Wei; Lin, Hsueh Pin; Perng, Dung-Ching.

TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. ed. / Matthew Laudon; Fiona Case; Bart Romanowicz; Fiona Case. TechConnect, 2018. p. 213-216 (TechConnect Briefs 2018 - Advanced Materials; Vol. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Huang DW, Lin HP, Perng D-C. Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. In Laudon M, Case F, Romanowicz B, Case F, editors, TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. TechConnect. 2018. p. 213-216. (TechConnect Briefs 2018 - Advanced Materials).