@inproceedings{07bb7b298a39433fba06da4d0a5facb6,
title = "Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer",
abstract = "This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×104 %. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×102 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R380nm/R450nm) of more than 102. The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.",
author = "Huang, {De Wei} and Lin, {Hsueh Pin} and Perng, {Dung Ching}",
year = "2018",
month = jan,
day = "1",
language = "English",
series = "TechConnect Briefs 2018 - Advanced Materials",
publisher = "TechConnect",
pages = "213--216",
editor = "Matthew Laudon and Fiona Case and Bart Romanowicz and Fiona Case",
booktitle = "TechConnect Briefs 2018 - Informatics, Electronics and Microsystems",
note = "11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference ; Conference date: 13-05-2018 Through 16-05-2018",
}