Visible Metasurfaces for On-Chip Polarimetry

Pin Chieh Wu; Jia Wern Chen; Chih Wei Yin; Yi Chieh Lai; Tsung Lin Chung; Chun Yen Liao; Bo Han Chen; Kuan Wei Lee; Chin Jung Chuang; Chih Ming Wang; Din Ping Tsai

doi:10.1021/acsphotonics.7b01527

Visible Metasurfaces for On-Chip Polarimetry

Pin Chieh Wu, Jia Wern Chen, Chih Wei Yin, Yi Chieh Lai, Tsung Lin Chung, Chun Yen Liao, Bo Han Chen, Kuan Wei Lee, Chin Jung Chuang, Chih Ming Wang, Din Ping Tsai

Department of Photonics

Research output: Contribution to journal › Article › peer-review

131 Citations (Scopus)

Abstract

Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

Original language	English
Pages (from-to)	2568-2573
Number of pages	6
Journal	ACS Photonics
Volume	5
Issue number	7
DOIs	https://doi.org/10.1021/acsphotonics.7b01527
Publication status	Published - 2018 Jul 18

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Biotechnology
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1021/acsphotonics.7b01527

Cite this

@article{09cd27301e3c4ab19a0ca0064bbd50a0,

title = "Visible Metasurfaces for On-Chip Polarimetry",

abstract = "Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.",

author = "Wu, {Pin Chieh} and Chen, {Jia Wern} and Yin, {Chih Wei} and Lai, {Yi Chieh} and Chung, {Tsung Lin} and Liao, {Chun Yen} and Chen, {Bo Han} and Lee, {Kuan Wei} and Chuang, {Chin Jung} and Wang, {Chih Ming} and Tsai, {Din Ping}",

note = "Funding Information: The authors acknowledge financial support from Ministry of Science and Technology, Taiwan (Grant Nos. MOST-106-2745-M-002-003-ASP and 104-2221-E-259-028-MY3) and Academia Sinica (Grant No. AS-103-TP-A06). They are also grateful to National Center for Theoretical Sciences, NEMS Research Center of National Taiwan University, National Center for High-Performance Computing, Taiwan, and Research Center for Applied Sciences, Academia Sinica, Taiwan for their supports. Publisher Copyright: Copyright {\textcopyright} 2017 American Chemical Society.",

year = "2018",

month = jul,

day = "18",

doi = "10.1021/acsphotonics.7b01527",

language = "English",

volume = "5",

pages = "2568--2573",

journal = "ACS Photonics",

issn = "2330-4022",

publisher = "American Chemical Society",

number = "7",

}

TY - JOUR

T1 - Visible Metasurfaces for On-Chip Polarimetry

AU - Wu, Pin Chieh

AU - Chen, Jia Wern

AU - Yin, Chih Wei

AU - Lai, Yi Chieh

AU - Chung, Tsung Lin

AU - Liao, Chun Yen

AU - Chen, Bo Han

AU - Lee, Kuan Wei

AU - Chuang, Chin Jung

AU - Wang, Chih Ming

AU - Tsai, Din Ping

N1 - Funding Information: The authors acknowledge financial support from Ministry of Science and Technology, Taiwan (Grant Nos. MOST-106-2745-M-002-003-ASP and 104-2221-E-259-028-MY3) and Academia Sinica (Grant No. AS-103-TP-A06). They are also grateful to National Center for Theoretical Sciences, NEMS Research Center of National Taiwan University, National Center for High-Performance Computing, Taiwan, and Research Center for Applied Sciences, Academia Sinica, Taiwan for their supports. Publisher Copyright: Copyright © 2017 American Chemical Society.

PY - 2018/7/18

Y1 - 2018/7/18

N2 - Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

AB - Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

UR - http://www.scopus.com/inward/record.url?scp=85050278299&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85050278299&partnerID=8YFLogxK

U2 - 10.1021/acsphotonics.7b01527

DO - 10.1021/acsphotonics.7b01527

M3 - Article

AN - SCOPUS:85050278299

SN - 2330-4022

VL - 5

SP - 2568

EP - 2573

JO - ACS Photonics

JF - ACS Photonics

IS - 7

ER -

Visible Metasurfaces for On-Chip Polarimetry

Abstract

All Science Journal Classification (ASJC) codes

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