VLSI Test Principles and Architectures

Laung Terng Wang, Cheng Wen Wu, Xiaoqing Wen

Research output: Book/ReportBook

429 Citations (Scopus)


This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Original languageEnglish
PublisherElsevier Inc.
ISBN (Print)9780123705976
Publication statusPublished - 2006 Jan 1

All Science Journal Classification (ASJC) codes

  • Business, Management and Accounting(all)


Dive into the research topics of 'VLSI Test Principles and Architectures'. Together they form a unique fingerprint.

Cite this