Wavelet based corner detection

Jiann Shu Lee, Yung Nien Sun, Chin Hsing Chen, Ching Tsorng Tsai

Research output: Contribution to journalArticlepeer-review

44 Citations (Scopus)


A non-parametric algorithm for detecting and locating corners of planar curves is proposed. The algorithm is based on the multiscale wavelet transform of the orientation of the curve which can effectively utilize both the information of local extrema positions and magnitudes of the transform results. The corner candidates can then be selected easily based on this information. According to the angle preserving concept, intrinsic ratios of several corner models have been derived and used to evaluate the corner candidates. The corner angles can also be obtained during these processes. To make the evaluation process robust a masking algorithm is proposed. Experiments depict that our detector is more effective than the single scale corner detectors, while is more efficient than the multiscale corner detector by Rattarangsi and Chin (Proc. Int. Conf. Pattern Recognition, pp. 923-930 (1990)).

Original languageEnglish
Pages (from-to)853-865
Number of pages13
JournalPattern Recognition
Issue number6
Publication statusPublished - 1993 Jun

All Science Journal Classification (ASJC) codes

  • Software
  • Signal Processing
  • Computer Vision and Pattern Recognition
  • Artificial Intelligence


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