Wavelet transform for corner detection

J. S. Lee; Y. N. Sun; C. H. Chen

doi:10.1109/ICSYSE.1992.236905

Wavelet transform for corner detection

J. S. Lee, Y. N. Sun, C. H. Chen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

Original language	English
Title of host publication	Proceedings of the IEEE International Conference on Systems Engineering
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	596-599
Number of pages	4
ISBN (Electronic)	0780307348, 9780780307346
DOIs	https://doi.org/10.1109/ICSYSE.1992.236905
Publication status	Published - 1992 Jan 1
Event	1992 IEEE International Conference on Systems Engineering - Kobe, Japan Duration: 1992 Sept 17 → 1992 Sept 19

Publication series

Name	Proceedings of the IEEE International Conference on Systems Engineering

Conference

Conference	1992 IEEE International Conference on Systems Engineering
Country/Territory	Japan
City	Kobe
Period	92-09-17 → 92-09-19

All Science Journal Classification (ASJC) codes

Fluid Flow and Transfer Processes
Signal Processing
Computational Mechanics
Industrial and Manufacturing Engineering
Control and Systems Engineering
Mechanical Engineering
Computational Mathematics
Control and Optimization

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10.1109/ICSYSE.1992.236905

Cite this

@inproceedings{9894408f42b74643a15ee4ce198bea93,

title = "Wavelet transform for corner detection",

abstract = "In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.",

author = "Lee, {J. S.} and Sun, {Y. N.} and Chen, {C. H.}",

year = "1992",

month = jan,

day = "1",

doi = "10.1109/ICSYSE.1992.236905",

language = "English",

series = "Proceedings of the IEEE International Conference on Systems Engineering",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "596--599",

booktitle = "Proceedings of the IEEE International Conference on Systems Engineering",

address = "United States",

note = "1992 IEEE International Conference on Systems Engineering ; Conference date: 17-09-1992 Through 19-09-1992",

}

Lee, JS, Sun, YN & Chen, CH 1992, Wavelet transform for corner detection. in Proceedings of the IEEE International Conference on Systems Engineering., 236905, Proceedings of the IEEE International Conference on Systems Engineering, Institute of Electrical and Electronics Engineers Inc., pp. 596-599, 1992 IEEE International Conference on Systems Engineering, Kobe, Japan, 92-09-17. https://doi.org/10.1109/ICSYSE.1992.236905

Wavelet transform for corner detection. / Lee, J. S.; Sun, Y. N.; Chen, C. H.
Proceedings of the IEEE International Conference on Systems Engineering. Institute of Electrical and Electronics Engineers Inc., 1992. p. 596-599 236905 (Proceedings of the IEEE International Conference on Systems Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Wavelet transform for corner detection

AU - Lee, J. S.

AU - Sun, Y. N.

AU - Chen, C. H.

PY - 1992/1/1

Y1 - 1992/1/1

N2 - In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

AB - In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

UR - http://www.scopus.com/inward/record.url?scp=84871616671&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84871616671&partnerID=8YFLogxK

U2 - 10.1109/ICSYSE.1992.236905

DO - 10.1109/ICSYSE.1992.236905

M3 - Conference contribution

T3 - Proceedings of the IEEE International Conference on Systems Engineering

SP - 596

EP - 599

BT - Proceedings of the IEEE International Conference on Systems Engineering

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 1992 IEEE International Conference on Systems Engineering

Y2 - 17 September 1992 through 19 September 1992

ER -

Wavelet transform for corner detection

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All Science Journal Classification (ASJC) codes

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