Wavelet transform for corner detection

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

Original languageEnglish
Title of host publicationProceedings of the IEEE International Conference on Systems Engineering
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages596-599
Number of pages4
ISBN (Electronic)0780307348, 9780780307346
DOIs
Publication statusPublished - 1992 Jan 1
Event1992 IEEE International Conference on Systems Engineering - Kobe, Japan
Duration: 1992 Sep 171992 Sep 19

Publication series

NameProceedings of the IEEE International Conference on Systems Engineering

Conference

Conference1992 IEEE International Conference on Systems Engineering
CountryJapan
CityKobe
Period92-09-1792-09-19

Fingerprint

Corner Detection
Wavelet transforms
Wavelet Transform
Detectors
Masking
Decay Rate
Wavelets
Curvature
Detector
Angle

All Science Journal Classification (ASJC) codes

  • Fluid Flow and Transfer Processes
  • Signal Processing
  • Computational Mechanics
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Mechanical Engineering
  • Computational Mathematics
  • Control and Optimization

Cite this

Lee, J. S., Sun, Y-N., & Chen, C-H. (1992). Wavelet transform for corner detection. In Proceedings of the IEEE International Conference on Systems Engineering (pp. 596-599). [236905] (Proceedings of the IEEE International Conference on Systems Engineering). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSYSE.1992.236905
Lee, J. S. ; Sun, Yung-Nien ; Chen, Chin-Hsing. / Wavelet transform for corner detection. Proceedings of the IEEE International Conference on Systems Engineering. Institute of Electrical and Electronics Engineers Inc., 1992. pp. 596-599 (Proceedings of the IEEE International Conference on Systems Engineering).
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title = "Wavelet transform for corner detection",
abstract = "In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.",
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Lee, JS, Sun, Y-N & Chen, C-H 1992, Wavelet transform for corner detection. in Proceedings of the IEEE International Conference on Systems Engineering., 236905, Proceedings of the IEEE International Conference on Systems Engineering, Institute of Electrical and Electronics Engineers Inc., pp. 596-599, 1992 IEEE International Conference on Systems Engineering, Kobe, Japan, 92-09-17. https://doi.org/10.1109/ICSYSE.1992.236905

Wavelet transform for corner detection. / Lee, J. S.; Sun, Yung-Nien; Chen, Chin-Hsing.

Proceedings of the IEEE International Conference on Systems Engineering. Institute of Electrical and Electronics Engineers Inc., 1992. p. 596-599 236905 (Proceedings of the IEEE International Conference on Systems Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Wavelet transform for corner detection

AU - Lee, J. S.

AU - Sun, Yung-Nien

AU - Chen, Chin-Hsing

PY - 1992/1/1

Y1 - 1992/1/1

N2 - In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

AB - In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

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Lee JS, Sun Y-N, Chen C-H. Wavelet transform for corner detection. In Proceedings of the IEEE International Conference on Systems Engineering. Institute of Electrical and Electronics Engineers Inc. 1992. p. 596-599. 236905. (Proceedings of the IEEE International Conference on Systems Engineering). https://doi.org/10.1109/ICSYSE.1992.236905