Wavelet transform for corner detection

J. S. Lee, Y. N. Sun, C. H. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

Original languageEnglish
Title of host publicationProceedings of the IEEE International Conference on Systems Engineering
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages596-599
Number of pages4
ISBN (Electronic)0780307348, 9780780307346
DOIs
Publication statusPublished - 1992 Jan 1
Event1992 IEEE International Conference on Systems Engineering - Kobe, Japan
Duration: 1992 Sep 171992 Sep 19

Publication series

NameProceedings of the IEEE International Conference on Systems Engineering

Conference

Conference1992 IEEE International Conference on Systems Engineering
CountryJapan
CityKobe
Period92-09-1792-09-19

All Science Journal Classification (ASJC) codes

  • Fluid Flow and Transfer Processes
  • Signal Processing
  • Computational Mechanics
  • Industrial and Manufacturing Engineering
  • Control and Systems Engineering
  • Mechanical Engineering
  • Computational Mathematics
  • Control and Optimization

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