White-light emissions from p-type porous silicon layers by high-temperature thermal annealing

W. C. Tsai, J. C. Lin, K. M. Huang, P. Y. Yang, S. J. Wang

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

In this study, the white-light emissions, including red, green and blue colors, appearing on the same porous silicon samples are originally introduced by a thermal-annealing method. The SEM, FTIR, and PL are discussed for different annealing temperature cases. The FTIR is used to monitor the chemical bonding structures of the PS samples under different annealing temperatures. The results show that the variation of chemical bonding relates to the variation of the emission wavelength. The emission intensities of the blue-green-light components are enhanced with the increase of annealing temperature. The PL spectra cover the entire visible region under the excitations of He-Cd laser beam, and a strong white-light emission can be observed by the naked eye at room temperature.

Original languageEnglish
Article number27002
JournalEPL
Volume85
Issue number2
DOIs
Publication statusPublished - 2009

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'White-light emissions from p-type porous silicon layers by high-temperature thermal annealing'. Together they form a unique fingerprint.

Cite this