X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la 0.56Li0.33TiO3 surface at room temperature

Kai Yun Yang; Kuan Zong Fung; Moo Chin Wang

doi:10.1063/1.2337787

X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la _0.56Li_0.33TiO₃ surface at room temperature

Kai Yun Yang, Kuan Zong Fung, Moo Chin Wang

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

30 Citations (Scopus)

Abstract

The donor doping process at the interface between the cation-deficient La_0.56Li_0.33TiO₃ and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti⁴⁺ 2p_3/2 toward the low energy side, due to the conversion of 12% Ti⁴⁺ to Ti³⁺. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized ⁶Li⁺ isotope ions. The doping with Ti ³⁺ donors, accompanying the insertion of Li⁺ ions into cation vacancies of La_0.56Li_0.33 TiO₃, yields the n-type semiconducting characteristics at room temperature.

Original language	English
Article number	056102
Journal	Journal of Applied Physics
Volume	100
Issue number	5
DOIs	https://doi.org/10.1063/1.2337787
Publication status	Published - 2006

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

Access to Document

10.1063/1.2337787

Cite this

@article{30fb3375f321499b8749aaf917a19a31,

title = "X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la 0.56Li0.33TiO3 surface at room temperature",

abstract = "The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.",

author = "Yang, {Kai Yun} and Fung, {Kuan Zong} and Wang, {Moo Chin}",

note = "Funding Information: This work is supported by the National Science Council of the Republic of China, Taiwan under Contract No. NSC 93-2120-M-006-004.",

year = "2006",

doi = "10.1063/1.2337787",

language = "English",

volume = "100",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "5",

}

TY - JOUR

T1 - X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la 0.56Li0.33TiO3 surface at room temperature

AU - Yang, Kai Yun

AU - Fung, Kuan Zong

AU - Wang, Moo Chin

N1 - Funding Information: This work is supported by the National Science Council of the Republic of China, Taiwan under Contract No. NSC 93-2120-M-006-004.

PY - 2006

Y1 - 2006

N2 - The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.

AB - The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.

UR - http://www.scopus.com/inward/record.url?scp=33748848474&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33748848474&partnerID=8YFLogxK

U2 - 10.1063/1.2337787

DO - 10.1063/1.2337787

M3 - Article

AN - SCOPUS:33748848474

SN - 0021-8979

VL - 100

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

M1 - 056102

ER -

X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la _0.56Li_0.33TiO₃ surface at room temperature

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this