X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la 0.56Li0.33TiO3 surface at room temperature

Kai Yun Yang, Kuan Zong Fung, Moo Chin Wang

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Abstract

The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.

Original languageEnglish
Article number056102
JournalJournal of Applied Physics
Volume100
Issue number5
DOIs
Publication statusPublished - 2006 Sep 26

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photoelectrons
lithium
examination
room temperature
x ray spectroscopy
insertion
ions
x rays
mass spectroscopy
photoelectron spectroscopy
cations
chemical equilibrium
isotopes
electric fields
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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title = "X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la 0.56Li0.33TiO3 surface at room temperature",
abstract = "The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12{\%} Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.",
author = "Yang, {Kai Yun} and Fung, {Kuan Zong} and Wang, {Moo Chin}",
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T1 - X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on la 0.56Li0.33TiO3 surface at room temperature

AU - Yang, Kai Yun

AU - Fung, Kuan Zong

AU - Wang, Moo Chin

PY - 2006/9/26

Y1 - 2006/9/26

N2 - The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.

AB - The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti 3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33 TiO3, yields the n-type semiconducting characteristics at room temperature.

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