Zinc oxysulfide thin films grown by pulsed laser deposition

Sundeep H. Deulkar, Jow-Lay Huang, Michael Neumann-Spallart

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Pulsed laser deposition was used to produce thin films of zinc oxysulfide (ZnO xS 1-x) on quartz substrates. The target was a sintered pellet (ZnO 0.39S 0.61) made of a solution precipitate. The film composition obtained by electron probe microanalysis (EPMA) was ZnO 0.41S 0.59, ZnO 0.44S 0.56, and ZnO 0.37S 0.63 for substrate temperatures of 450°C, 540°C, and 630°C, respectively. X-ray diffraction (XRD) showed that samples deposited at 450°C and at 540°C had a prominent cubic sphalerite phase, whereas samples deposited at 630°C consisted of three phases, viz. hexagonal wurtzite and cubic sphalerite (ZnS), and hexagonal zincite (ZnO). With respect to the tabulated lattice spacings for sphalerite (cell constant 0.5406 nm), distinct shifts were observed for the low temperature samples, yielding cell constants around 0.533 nm. Transmission electron microscopy (TEM)-selected area electron diffraction studies support the XRD data. Patterns of films deposited at 540°C could be indexed as sphalerite, with similar lattice shifts as in XRD, resulting in a cell constant of 0.53. Locally highly resolved chemical analysis by TEM-energy dispersive x-ray analysis revealed a stoichiometry that was consistent with the EPMA results. Ultraviolet (UV)-visible transmission measurements of the films led to bandgap energies around 3.3 eV, which is well below the reported bandgap energies of ZnS.

Original languageEnglish
Pages (from-to)589-594
Number of pages6
JournalJournal of Electronic Materials
Volume39
Issue number5
DOIs
Publication statusPublished - 2010 May 1

Fingerprint

zincblende
Pulsed laser deposition
pulsed laser deposition
Zinc
zinc
Electron probe microanalysis
X ray diffraction
Thin films
Energy gap
electron probes
thin films
microanalysis
Transmission electron microscopy
cells
diffraction
Substrates
Chemical analysis
Electron diffraction
Stoichiometry
x ray analysis

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Deulkar, Sundeep H. ; Huang, Jow-Lay ; Neumann-Spallart, Michael. / Zinc oxysulfide thin films grown by pulsed laser deposition. In: Journal of Electronic Materials. 2010 ; Vol. 39, No. 5. pp. 589-594.
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Zinc oxysulfide thin films grown by pulsed laser deposition. / Deulkar, Sundeep H.; Huang, Jow-Lay; Neumann-Spallart, Michael.

In: Journal of Electronic Materials, Vol. 39, No. 5, 01.05.2010, p. 589-594.

Research output: Contribution to journalArticle

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