TY - GEN
T1 - ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution
AU - Adriyanto, Feri
AU - Sze, Po Wen
AU - Wang, Yeong Her
PY - 2008/12/1
Y1 - 2008/12/1
N2 - The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2-6H2O and hexamethylenetetramine C12H6N4 solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods' microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 μm and a 3.0 μm rod length.
AB - The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2-6H2O and hexamethylenetetramine C12H6N4 solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods' microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 μm and a 3.0 μm rod length.
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U2 - 10.1109/ICSICT.2008.4734608
DO - 10.1109/ICSICT.2008.4734608
M3 - Conference contribution
AN - SCOPUS:60649094797
SN - 9781424421855
T3 - International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT
SP - 592
EP - 595
BT - ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
T2 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
Y2 - 20 October 2008 through 23 October 2008
ER -