ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution

Feri Adriyanto, Po Wen Sze, Yeong Her Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2-6H2O and hexamethylenetetramine C12H6N4 solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods' microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 μm and a 3.0 μm rod length.

Original languageEnglish
Title of host publicationICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
Pages592-595
Number of pages4
DOIs
Publication statusPublished - 2008 Dec 1
Event2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008 - Beijing, China
Duration: 2008 Oct 202008 Oct 23

Publication series

NameInternational Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

Other

Other2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
CountryChina
CityBeijing
Period08-10-2008-10-23

Fingerprint

Methenamine
Zinc Oxide
hexamethylenetetramine
Zinc oxide
Nanorods
zinc oxides
nanorods
nitrates
Nitrates
Zinc
plastics
zinc
Plastics
Substrates
microphotographs
Crystals
Polyethylene Terephthalates
x rays
polyethylene terephthalate
ITO (semiconductors)

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Adriyanto, F., Sze, P. W., & Wang, Y. H. (2008). ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution. In ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings (pp. 592-595). [4734608] (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT). https://doi.org/10.1109/ICSICT.2008.4734608
Adriyanto, Feri ; Sze, Po Wen ; Wang, Yeong Her. / ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution. ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings. 2008. pp. 592-595 (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT).
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abstract = "The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2-6H2O and hexamethylenetetramine C12H6N4 solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods' microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 μm and a 3.0 μm rod length.",
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Adriyanto, F, Sze, PW & Wang, YH 2008, ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution. in ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings., 4734608, International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT, pp. 592-595, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008, Beijing, China, 08-10-20. https://doi.org/10.1109/ICSICT.2008.4734608

ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution. / Adriyanto, Feri; Sze, Po Wen; Wang, Yeong Her.

ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings. 2008. p. 592-595 4734608 (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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N2 - The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2-6H2O and hexamethylenetetramine C12H6N4 solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods' microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 μm and a 3.0 μm rod length.

AB - The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2-6H2O and hexamethylenetetramine C12H6N4 solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods' microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 μm and a 3.0 μm rod length.

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T3 - International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

SP - 592

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BT - ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings

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Adriyanto F, Sze PW, Wang YH. ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution. In ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings. 2008. p. 592-595. 4734608. (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT). https://doi.org/10.1109/ICSICT.2008.4734608