光響應電容電壓量測方法對薄膜電晶體型電荷擷取式記憶體能隙內能態密度研究

Translated title of the thesis: Investigation of subgap density of states in TFT charge trapping memory with optical response of capacitance-voltage measurement
  • 江 彥樟

Student thesis: Master's Thesis

Abstract

Date of Award2017 Aug 18
Original languageChinese
SupervisorJen-Sue Chen (Supervisor)

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