Correlation between Subgap Density of States and Shift in Capacitance-Voltage and Transfer Curves of Zinc Tin Oxide Thin Film Transistor under Gate Bias and Illumination Stress

  • 吳 廷豐

Student thesis: Doctoral Thesis

Abstract

none
Date of Award2019
Original languageEnglish
SupervisorJen-Sue Chen (Supervisor)

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