Gate Oxide scaling Effect on MOSFETs and TFETs by TCAD Simulations

  • 尤 磊安

Student thesis: Master's Thesis

Abstract

Date of Award2018 Aug 15
Original languageEnglish
SupervisorKuo-Hsing Kao (Supervisor)

Cite this

Gate Oxide scaling Effect on MOSFETs and TFETs by TCAD Simulations
磊安, 尤. (Author). 2018 Aug 15

Student thesis: Master's Thesis