電機資訊學院

指紋 查看啟用 電機資訊學院 的研究主題。這些主題標籤來自此機構會員的作品。共同形成了獨特的指紋。

Engineering & Materials Science

Electric potential
Networks (circuits)
Light emitting diodes
High electron mobility transistors
Temperature
Data storage equipment
Substrates
Metals
Controllers
Photodetectors
Sensors
Dielectric properties
Microwaves
Costs
Communication
Thin film transistors
Bandwidth
Transistors
Semiconductor materials
Doping (additives)
Capacitors
Nanowires
Hardware
Thin films
Switches
Oxides
Heterojunctions
Neural networks
Electric power utilization
Leakage currents
Transconductance
Indium
Experiments
Pixels
Annealing
Fabrication
Network protocols
Permittivity
Diodes
Sintering
Electric breakdown
Scheduling
Zinc oxide
Field effect transistors
Silicon
Bandpass filters
Processing
Semiconductor quantum wells
Code division multiple access
Electric properties
Throughput
Resonators
Wireless networks
Oxide films
Threshold voltage
Heterojunction bipolar transistors
Electrodes
Topology
Organic light emitting diodes (OLED)
Servers
Nanorods
Feedback
Monitoring
Wavelength
Molecular beam epitaxy
Digital to analog conversion
Internet
DC-DC converters
Gate dielectrics
Antennas
Color
Chemical vapor deposition
Nitrides
Degradation
Microstructure
Wireless sensor networks
Buffer layers
Testing
Ultrasonics
Current density
Defects
Quality of service
Liquid crystal displays
Metallorganic chemical vapor deposition
Hydrogen
Sputtering
Photoluminescence
Lighting
Passivation
Time delay
Tuning
Asynchronous generators
Genetic algorithms
Industry
Built-in self test
Bipolar transistors
Cryptography
Display devices
Image coding
Electrons

Chemical Compounds

Metals
Light emitting diodes
High electron mobility transistors
Temperature
Substrates
Dielectric properties
Electric potential
Microwaves
Oxides
Photodetectors
Thin film transistors
Zinc Oxide
Doping (additives)
Thin films
Nanowires
Networks (circuits)
Sintering
Heterojunctions
Annealing
Leakage currents
Permittivity
Semiconductor materials
Silicon
Aluminum Oxide
Fabrication
Transconductance
Transistors
Electric properties
Electric breakdown
Oxide films
Organic light emitting diodes (OLED)
Nanorods
Field effect transistors
Indium
Buffer layers
Microstructure
Electrodes
Diodes
Hydrogen
Heterojunction bipolar transistors
Bandpass filters
Molecular beam epitaxy
Nitrides
Threshold voltage
Sputtering
Semiconductor quantum wells
Sensors
Gate dielectrics
Chemical vapor deposition
Phosphors
Current density
Photoluminescence
Solar cells
Microwave frequencies
Metallorganic chemical vapor deposition
Passivation
Electrons
Bipolar transistors
Wavelength
Copper
Dark currents
Nanoparticles
Resonators
Ions
X ray diffraction
Etching
Optical properties
Gases
Ohmic contacts
Natural frequencies
Graphite
Pixels
Oxygen
Resonant tunneling
Liquids
Chemical analysis
Thermodynamic stability
Oxidation
Glass
Ultrasonics
Diamond
Crystalline materials
Magnetron sputtering
Defects
Scanning electron microscopy
gallium arsenide
Multilayers
Gates (transistor)
Data storage equipment
Diffusion barriers
Gallium
Degradation
Plasmas
Conversion efficiency
Lighting
Capacitors
Epitaxial layers
Energy gap
Display devices
Air

Physics & Astronomy

Engineering

light emitting diodes
field effect transistors
photometers
transistors
high electron mobility transistors
bipolar transistors
dielectric properties
metal oxide semiconductors
annealing
nanowires
heterojunctions
resonators
CMOS
filters
transconductance
fabrication
bandpass filters
permittivity
electrodes
nanorods
solar cells
Schottky diodes
electrical properties
electrical faults
etching
sputtering
x rays
dark current
MIS (semiconductors)
direct current
diodes
broadband
accumulators
magnetron sputtering
bandwidth
communication

Physics

electric potential
temperature
quantum wells
photoluminescence
room temperature
wavelengths
impedance
current density
coefficients
optical properties
modulation
threshold voltage

Chemistry and Materials

ceramics
zinc oxides
oxides
nitrides
indium oxides
molecular beam epitaxy
silicon
tin oxides
aluminum gallium arsenides
hydrogen
sapphire
oxidation
indium
oxygen
glass
gases

General

thin films
microwaves
metals
sensors
output
metalorganic chemical vapor deposition
leakage
emitters
sintering
electric contacts
buffers
vapor deposition
augmentation
microstructure
chips
waveguides
oxide films
defects
liquid phases
passivity
injection
attack
coding
caps
simulation
rejection
insulators
resonant frequencies
Q factors
lasers
resonant tunneling
retarding
microwave frequencies
switches
templates
capacitors