電機資訊學院

指紋 查看啟用 電機資訊學院 的研究主題。這些主題標籤來自此機構會員的作品。共同形成了獨特的指紋。

Engineering & Materials Science

Electric potential
Networks (circuits)
Light emitting diodes
High electron mobility transistors
Data storage equipment
Temperature
Substrates
Controllers
Metals
Dielectric properties
Microwaves
Sensors
Costs
Photodetectors
Communication
Bandwidth
Transistors
Doping (additives)
Thin film transistors
Capacitors
Nanowires
Hardware
Semiconductor materials
Neural networks
Switches
Electric power utilization
Thin films
Heterojunctions
Oxides
Experiments
Pixels
Leakage currents
Transconductance
Fabrication
Network protocols
Permittivity
Sintering
Annealing
Scheduling
Indium
Electric breakdown
Field effect transistors
Bandpass filters
Diodes
Processing
Code division multiple access
Silicon
Throughput
Resonators
Semiconductor quantum wells
Wireless networks
Zinc oxide
Topology
Electric properties
Threshold voltage
Servers
Monitoring
Heterojunction bipolar transistors
Organic light emitting diodes (OLED)
Digital to analog conversion
Feedback
Internet
Electrodes
Color
DC-DC converters
Antennas
Testing
Wireless sensor networks
Microstructure
Gate dielectrics
Molecular beam epitaxy
Nitrides
Wavelength
Oxide films
Degradation
Ultrasonics
Current density
Chemical vapor deposition
Quality of service
Defects
Liquid crystal displays
Time delay
Lighting
Nanorods
Tuning
Display devices
Industry
Buffer layers
Genetic algorithms
Asynchronous generators
Metallorganic chemical vapor deposition
Built-in self test
Cryptography
Bipolar transistors
Classifiers
Hydrogen
Image coding
Sputtering
Electrocardiography
Clocks

Chemical Compounds

Metals
Light emitting diodes
High electron mobility transistors
Temperature
Dielectric properties
Substrates
Electric potential
Microwaves
Oxides
Photodetectors
Nanowires
Doping (additives)
Thin films
Thin film transistors
Zinc Oxide
Networks (circuits)
Sintering
Heterojunctions
Permittivity
Leakage currents
Annealing
Silicon
Fabrication
Semiconductor materials
Transistors
Aluminum Oxide
Transconductance
Electric breakdown
Electric properties
Organic light emitting diodes (OLED)
Field effect transistors
Microstructure
Indium
Oxide films
Bandpass filters
Heterojunction bipolar transistors
Nitrides
Hydrogen
Threshold voltage
Electrodes
Nanorods
Semiconductor quantum wells
Buffer layers
Sputtering
Molecular beam epitaxy
Gate dielectrics
Diodes
Phosphors
Sensors
Current density
Chemical vapor deposition
Microwave frequencies
Solar cells
Metallorganic chemical vapor deposition
Bipolar transistors
Photoluminescence
Electrons
Nanoparticles
Copper
Graphite
Pixels
Passivation
Resonators
X ray diffraction
Dark currents
Ions
Natural frequencies
Wavelength
Liquids
Gases
Resonant tunneling
Glass
Etching
Optical properties
Chemical analysis
Scanning electron microscopy
Diamond
Ultrasonics
Magnetron sputtering
Oxygen
Crystalline materials
Thermodynamic stability
Defects
Multilayers
Data storage equipment
gallium arsenide
Display devices
Lighting
Diffusion barriers
Plasmas
Oxidation
Capacitors
Degradation
Genes
Gates (transistor)
Polysilicon
Bandwidth
Drain current
Powders
Air

Physics & Astronomy

Engineering

light emitting diodes
field effect transistors
photometers
transistors
high electron mobility transistors
bipolar transistors
dielectric properties
metal oxide semiconductors
nanowires
heterojunctions
annealing
resonators
CMOS
fabrication
filters
bandpass filters
transconductance
permittivity
electrodes
solar cells
electrical faults
etching
Schottky diodes
electrical properties
nanorods
dark current
sputtering
x rays
MIS (semiconductors)
direct current
accumulators
bandwidth
broadband
communication
magnetron sputtering
diodes

Chemistry and Materials

ceramics
oxides
zinc oxides
nitrides
indium oxides
molecular beam epitaxy
silicon
aluminum gallium arsenides
tin oxides
hydrogen
sapphire
glass
indium
oxygen
gases
oxidation

Physics

electric potential
temperature
quantum wells
impedance
current density
photoluminescence
room temperature
wavelengths
coefficients
optical properties
threshold voltage
modulation
electrons

General

thin films
microwaves
metals
output
sensors
leakage
metalorganic chemical vapor deposition
emitters
sintering
vapor deposition
buffers
augmentation
microstructure
chips
liquid phases
attack
injection
electric contacts
defects
coding
caps
simulation
resonant frequencies
oxide films
passivity
rejection
Q factors
insulators
resonant tunneling
microwave frequencies
retarding
switches
capacitors
surface emitting lasers
templates