E化製造研究中心

研究成果 2006 2019

  • 20 Article
  • 12 Conference contribution
  • 2 Conference article
篩選
Article
2019

A Gradual Refreshing Scheme for Improving Tool Utilization

Yang, H. C., Tsai, T. H., Tieng, H. & Cheng, F. T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 515-522 8 p., 8605344.

研究成果: Article

Machining
Availability
Modeling
Model
Coating

A Novel Efficient Big Data Processing Scheme for Feature Extraction in Electrical Discharge Machining

Chen, C. C., Hung, M. H., Suryajaya, B., Lin, Y. C., Yang, H. C., Huang, H. C. & Cheng, F. T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 910-917 8 p., 8605347.

研究成果: Article

Electric discharge machining
Machining
Feature Extraction
Feature extraction
Electric sparks

Time Series Prediction Algorithm for Intelligent Predictive Maintenance

Lin, C. Y., Hsieh, Y. M., Cheng, F. T., Huang, H. C. & Adnan, M., 2019 七月, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2807-2814 8 p., 8721101.

研究成果: Article

Time Series Prediction
Time series
Maintenance
Target
Exponential Model
2018
1 引文 (Scopus)

Automatic Virtual Metrology and Deformation Fusion Scheme for Engine-Case Manufacturing

Tieng, H., Tsai, T. H., Chen, C. F., Yang, H. C., Huang, J. W. & Cheng, F. T., 2018 四月 1, 於 : IEEE Robotics and Automation Letters. 3, 2, p. 934-941 8 p., 8255616.

研究成果: Article

Metrology
Fusion
Engine
Fusion reactions
Manufacturing
2017
3 引文 (Scopus)
Wear of materials
Neural networks
Industrial plants
Logistics
Machining
5 引文 (Scopus)

Automatic Virtual Metrology and Target Value Adjustment for Mass Customization

Tieng, H., Chen, C. F., Cheng, F. T. & Yang, H. C., 2017 四月 1, 於 : IEEE Robotics and Automation Letters. 2, 2, p. 546-553 8 p., 7801027.

研究成果: Article

Mass Customization
Metrology
Wheels
Adjustment
Wheel
27 引文 (Scopus)
Thing
Manufacturing
Internet of Things
Semiconductor Manufacturing
Manufacturing Industries
5 引文 (Scopus)
Multi-model
Metrology
Industrial plants
Model
Cloud computing
2016
4 引文 (Scopus)

Automatic virtual metrology for wheel machining automation

Yang, H. C., Tieng, H. & Cheng, F. T., 2016 十一月 1, 於 : International Journal of Production Research. 54, 21, p. 6367-6377 11 p.

研究成果: Article

Wheels
Machining
Automation
Inspection
Machine tools
18 引文 (Scopus)

Industry 4.1 for Wheel Machining Automation

Cheng, F. T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Machining
Wheel
Automation
Wheels
Industry
9 引文 (Scopus)
Machine tools
Inspection
Machining
Feature extraction
Cleaning
2015
11 引文 (Scopus)
Metrology
Semiconductors
Industry
Semiconductor materials
Servers
2013

Mobile monitoring and control framework with active-push and plug-and-play capabilities

Chang, A. Y., Li, Y-Y., Hung, M. H. & Yen, T. F., 2013 九月 26, 於 : Assembly Automation. 33, 4, p. 317-333 17 p., 17096521.

研究成果: Article

Monitoring
Industrial plants
Control systems
Automation
Mobile devices
12 引文 (Scopus)

VM-based baseline predictive maintenance scheme

Hsieh, Y. S., Cheng, F. T., Huang, H. C., Wang, C. R., Wang, S. C. & Yang, H. C., 2013 二月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 132-144 13 p., 6304937.

研究成果: Article

maintenance
Failure analysis
prognosis
Degradation
metrology
2012
54 引文 (Scopus)

Developing an automatic virtual metrology system

Cheng, F. T., Huang, H. C. & Kao, C. A., 2012 一月 1, 於 : IEEE Transactions on Automation Science and Engineering. 9, 1, p. 181-188 8 p., 6051498.

研究成果: Article

Industrial plants
Semiconductor materials
Thin film transistors
Liquid crystal displays
Optoelectronic devices
9 引文 (Scopus)

Development of an AVM System Implementation Framework

Hung, M. H., Chen, C. F., Huang, H. C., Yang, H. C. & Cheng, F. T., 2012 一月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 4, p. 598-613 16 p.

研究成果: Article

metrology
industrial plants
Industrial plants
Thin film transistors
Liquid crystal displays
2011
30 引文 (Scopus)

Benefit model of virtual metrology and integrating AVM into MES

Cheng, F. T., Chang, J. Y. C., Huang, H. C., Kao, C. A., Chen, Y. L. & Peng, J. L., 2011 五月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 24, 2, p. 261-272 12 p., 5682063.

研究成果: Article

metrology
manufacturing
Semiconductor materials
inspection
Inspection
2007
60 引文 (Scopus)

Dual-phase virtual metrology scheme

Cheng, F. T., Huang, H. C. & Kao, C. A., 2007 十一月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 20, 4, p. 566-571 6 p., 4369327.

研究成果: Article

metrology
wafers
Thin film transistors
Liquid crystal displays
Glass
2006
35 引文 (Scopus)

Intelligent prognostics system design and implementation

Su, Y. C., Cheng, F. T., Hung, M. H. & Huang, H. C., 2006 五月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 19, 2, p. 195-206 12 p.

研究成果: Article

Intelligent systems
systems engineering
Systems analysis
Liquid crystal displays
industrial plants