浩志 劉 的照片

查看斯高帕斯 (Scopus) 概要

劉 浩志

教授

 https://orcid.org/0000-0002-5914-5461
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
20002023

每年研究成果

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篩選
Conference contribution

搜尋結果

  • 2018

    Improved contact lens injection molding production by 3D printed conformal cooling channels

    Lin, Y. F., Wu, J. R., Liu, B. H., Wei, W. C. J., Wang, A. B. & Luo, R. C., 2018 2月 1, SII 2017 - 2017 IEEE/SICE International Symposium on System Integration. Institute of Electrical and Electronics Engineers Inc., p. 89-94 6 p. (SII 2017 - 2017 IEEE/SICE International Symposium on System Integration; 卷 2018-January).

    研究成果: Conference contribution

    6 引文 斯高帕斯（Scopus）
  • 2016

    3D printing of low melting temperature alloys by fused deposition modeling

    Hsieh, P. C., Tsai, C. H., Liu, B. H., Wei, W. C. J., Wang, A. B. & Luo, R. C., 2016 5月 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1138-1142 5 p. 7474915. (Proceedings of the IEEE International Conference on Industrial Technology; 卷 2016-May).

    研究成果: Conference contribution

    14 引文 斯高帕斯（Scopus）

  • Ceramic feedstocks for additive manufacturing

    Fan, N. C., Wei, W. C. J., Liu, B. H., Wang, A. B. & Luo, R. C., 2016 5月 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1147-1151 5 p. 7474917. (Proceedings of the IEEE International Conference on Industrial Technology; 卷 2016-May).

    研究成果: Conference contribution

    4 引文 斯高帕斯（Scopus）

  • Cu-based alloys for 3DP by melt extrusion process

    Chou, C. S., Wei, W. C. J., Liu, B. H., Wang, A. B. & Luo, R. C., 2016 5月 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1152-1157 6 p. 7474918. (Proceedings of the IEEE International Conference on Industrial Technology; 卷 2016-May).

    研究成果: Conference contribution

  • Design and test of additive manufacturing for coating thermoplastic PEEK material

    Liu, C. Y., Hsieh, Y. W., Sun, T. J., Zeng, J. W., Wang, A. B., Lee, N. T., Chau, S. W., Wei, W. C., Liu, B. H. & Luo, R. C., 2016 5月 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1158-1162 5 p. 7474919. (Proceedings of the IEEE International Conference on Industrial Technology; 卷 2016-May).

    研究成果: Conference contribution

    6 引文 斯高帕斯（Scopus）

  • Glass and hot extrusion by ME module for 3D additive manufacturing

    Wang, P. W., Chou, C. S., Wei, W. C. J., Liu, B. H., Liu, A., Wang, A. B. & Luo, R. C., 2016 5月 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1167-1171 5 p. 7474920. (Proceedings of the IEEE International Conference on Industrial Technology; 卷 2016-May).

    研究成果: Conference contribution

    2 引文 斯高帕斯（Scopus）
  • 2014

    Effects of temperature on surface accumulation and release of silica nanoparticles in an epoxy nanocoating exposed to UV radiation

    Tien, C. C., Chang, C. H., Liu, B. H., Stanley, D., Rabb, S. A., Yu, L. L., Nguyen, T. & Sung, L., 2014 1月 1, Technical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014. Nano Science and Technology Institute, p. 101-104 4 p. (Technical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014; 卷 3).

    研究成果: Conference contribution

    1 引文 斯高帕斯（Scopus）
  • 2008

    Recent CD AFM probe developments for sub-45 nm technology nodes

    Liu, B. H., Osborne, J. R., Dahlen, G. A., Greschner, J., Bayer, T., Kalt, S. & Fritz, G., 2008 12月 1, Metrology, Inspection, and Process Control for Microlithography XXII. 69222J. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6922).

    研究成果: Conference contribution

    11 引文 斯高帕斯（Scopus）

  • TEM validation of CD AFM image reconstruction: Part II

    Dahlen, G. A., Liu, H. C., Osborn, M., Osborne, J. R., Tracy, B. & Del Rosario, A., 2008 12月 1, Metrology, Inspection, and Process Control for Microlithography XXII. 69220K. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6922).

    研究成果: Conference contribution

    8 引文 斯高帕斯（Scopus）
  • 2007

    Advanced CD-AFM probe tip shape characterization for metrology accuracy and throughput

    Liu, H. C., Osborne, J. R., Osborn, M. & Dahlen, G. A., 2007, Metrology, Inspection, and Process Control for Microlithography XXI. PART 3 編輯 65183K. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6518, 編號 PART 3).

    研究成果: Conference contribution

    19 引文 斯高帕斯（Scopus）

  • Measurement uncertainty in nanometrology: Leveraging attributes of TEM and CD AFM

    Liu, H-C., Dahlen, G. A., Osborn, M., Osborne, J. R., Mininni, L., Tracy, B. & Del Rosario, A., 2007, 2007 IEEE Instrumentation and Measurement Technology, IMTC 2007 - Conference Proceedings - Synergy of Science and Technology in Instrumentation and Measurement. 4258228

    研究成果: Conference contribution

    4 引文 斯高帕斯（Scopus）

  • TEM validation of CD AFM image reconstruction

    Dahlen, G. A., Mininni, L., Osborn, M., Liu, B. H., Osborne, J. R., Tracy, B. & Del Rosario, A., 2007 10月 15, Metrology, Inspection, and Process Control for Microlithography XXI. PART 1 編輯 651818. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6518, 編號 PART 1).

    研究成果: Conference contribution

    19 引文 斯高帕斯（Scopus）
  • 2006

    Carbon nanotube AFM probes for microlithography process control

    Liu, H. C., Fong, D., Dahlen, G. A., Osborn, M., Hand, S. & Osborne, J. R., 2006 7月 11, Metrology, Inspection, and Process Control for Microlithography XX. 61522Y. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6152 II).

    研究成果: Conference contribution

    19 引文 斯高帕斯（Scopus）

  • Critical dimension AFM tip characterization and image reconstruction applied to the 45 nm node

    Dahlen, G., Osborn, M., Liu, B. H., Jain, R., Foreman, W. & Osborne, J. R., 2006 7月 10, Metrology, Inspection, and Process Control for Microlithography XX. 61522R. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6152 II).

    研究成果: Conference contribution

    29 引文 斯高帕斯（Scopus）