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查看斯高帕斯 (Scopus) 概要
施 權峰
教授
電機工程學系
奈米積體電路工程博士學位學程
電話
886 6 2757575 ext 62398
電子郵件
cfshih
mail.ncku.edu
tw
網站
http://www.ee.ncku.edu.tw/subpage_div/teacher_new_2/index2.php?teacher_id=159
h-index
1242
引文
21
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
2000
2024
每年研究成果
概覽
指紋
網路
專案
(22)
研究成果
(103)
類似的個人檔案
(6)
監製作品
(24)
指紋
查看啟用 Chuan-Feng Shih 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Engineering & Materials Science
Perovskite
100%
Sputtering
81%
Thin films
70%
Oxides
64%
Doping (additives)
63%
Ion beams
60%
Dielectric properties
59%
Buffer layers
59%
Microwaves
58%
Permittivity
57%
Annealing
53%
Temperature
52%
Heterojunctions
51%
Nanocrystals
47%
Superlattices
47%
Substrates
44%
Solar cells
44%
Sintering
43%
Silicon
43%
Light emitting diodes
42%
Optical properties
40%
Microwave frequencies
37%
Organic solar cells
36%
Perovskite solar cells
34%
Sapphire
34%
Electric properties
32%
Metals
31%
Natural frequencies
31%
Oxide semiconductors
29%
Ilmenite
29%
Epilayers
28%
Oxide films
28%
Photodetectors
27%
Capacitors
26%
Electrons
26%
Nanowires
26%
Field emission
25%
Positive ions
25%
Crystallinity
24%
Energy gap
24%
Photoelectron spectroscopy
23%
Heat treatment
23%
Electroluminescence
22%
Photoelectrons
22%
Conduction bands
21%
Conversion efficiency
21%
Thin film solar cells
20%
Magnesium
20%
Leakage currents
20%
Full width at half maximum
19%
Chemical Compounds
Liquid Film
74%
Sputtering
64%
Microwave
56%
Solar Cell
51%
Ceramic
49%
Dielectric Property
46%
Oxide
41%
Sulfurization
38%
Dielectric Material
38%
Superlattice
36%
Dielectric Constant
36%
Sintering
34%
Voltage
33%
Thermoelectricity
31%
Annealing
31%
Capacitor
29%
Nanocrystal
27%
Trap Density Measurement
25%
Leakage Current
24%
Buffer Solution
23%
Epitaxial Growth
20%
Surface
19%
Optical Property
19%
Short Circuit
19%
Band Gap
18%
Crystallinity
17%
Figure of Merit
17%
Vapor Phase Epitaxy
17%
Heat Treatment
16%
Magnesium Atom
15%
Photovoltaic Effect
15%
Nanowire
15%
Band Bending
15%
Electroluminescence
14%
Photoelectron
14%
Field Emission
14%
Band Offset
14%
X-Ray Diffractometry
14%
Electron Particle
13%
Electrical Property
13%
Fowler-Nordheim Tunneling
13%
Grain Size
12%
Communication
12%
Monopole
12%
Thermal Conductivity
11%
Interfacial Defect
11%
Lightning
11%
Physics & Astronomy
solar cells
56%
sputtering
40%
silicon oxides
37%
perovskites
35%
light emitting diodes
34%
superlattices
32%
ceramics
31%
vapor phase epitaxy
30%
nanocrystals
29%
ion beams
27%
oxide films
26%
cracks
26%
buffers
25%
dielectric properties
25%
microwaves
24%
thin films
24%
sapphire
24%
microwave frequencies
22%
annealing
22%
heterojunctions
20%
templates
20%
silicon
19%
electron mobility
18%
x rays
18%
temperature
18%
resonant frequencies
18%
nucleation
17%
phenyls
17%
short circuit currents
17%
photoelectrons
17%
heat treatment
16%
sintering
16%
field emission
15%
permittivity
15%
electric potential
15%
transmission electron microscopy
14%
transmission lines
13%
photoluminescence
13%
electrical properties
13%
electric contacts
12%
antennas
12%
crystallization
12%
optical properties
12%
open circuit voltage
12%
coefficients
11%
metals
11%
mixed oxides
11%
reflectance
11%
capacitors
10%
interlayers
10%
