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查看斯高帕斯 (Scopus) 概要
吳 忠霖
教授
物理學系
電話
886 6 2757575 ext 65219/ 65212 ext 21
電子郵件
clwuphys
mail.ncku.edu
tw
網站
http://www.phys.ncku.edu.tw/~clwuphys/
h-index
2171
引文
26
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1999 …
2025
每年研究成果
概覽
指紋
網路
專案
(15)
研究成果
(73)
類似的個人檔案
(6)
監製作品
(15)
指紋
查看啟用 Chung-Lin Wu 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Material Science
Aluminum Nitride
64%
Band Offset
19%
Bismuth Ferrite
27%
Boron Nitride
20%
Buffer Layer
14%
Carrier Concentration
23%
Cobalt
18%
Density
20%
Electronic Property
13%
Epilayers
20%
Epitaxial Film
48%
Epitaxy
27%
Ferroelectric Material
33%
Film
45%
Gallium Arsenide
20%
Graphene
78%
Heteroepitaxy
68%
Heterojunction
83%
Humidity Sensor
29%
Indium
13%
Lattice Constant
11%
Molecular Beam Epitaxy
43%
Monolayer
19%
Nanoclusters
16%
Nanocomposite
20%
Nanorod
27%
Nanostructure
21%
Nanowire
30%
Nitride Compound
33%
Nitriding
27%
Optical Property
58%
Oxide Compound
29%
Photoemission Spectroscopy
14%
Photoluminescence
100%
Piezoelectricity
27%
Quantum Dot
20%
Reflection High-Energy Electron Diffraction
17%
Scanning Photoelectron Microscopy
20%
Scanning Tunneling Microscopy
19%
Silicon
12%
Silicon Nitride
26%
Solar Cell
30%
Superlattice
13%
Surface (Surface Science)
81%
Thin Films
18%
Transmission Electron Microscopy
18%
Two-Dimensional Material
14%
Ultrathin Film
12%
X-Ray Diffraction
12%
ZnO
61%
Engineering
Anions and Cation
9%
Anisotropic
13%
Band Bending
16%
Band Gap
13%
Blueshift
9%
Broadening
9%
Carbon Nanotube
9%
Carrier Concentration
11%
Charge Carrier
9%
Charged Surface
9%
Chemical Vapor Deposition
11%
Colloid
9%
Core Level
28%
Crystal Structure
12%
Dielectrics
9%
Dilute Nitride
9%
Electric Field
11%
Fermi Level
9%
Few-Layer Graphene
9%
Flat Surface
11%
Gallium Arsenide
9%
Gap Semiconductor
9%
Graphene
36%
Heterojunctions
11%
Heterostructures
9%
High Aspect Ratio
9%
High Resolution
9%
Induced Polarization
13%
Interlayer
12%
Lateral Force
9%
Layer Graphene
14%
Molybdenum Disulfide
9%
Monolayer
11%
Nanowire
11%
Nitride
27%
Optoelectronics
18%
Photoelectron
31%
Photon Excitation
9%
Piezoelectric
18%
Polarization Direction
9%
Scanning Probe Lithography
9%
Scanning Tunneling Microscopy
20%
Si Substrate
9%
Spontaneous Emission
9%
Sublattice
9%
Terminated Surface
9%
Thermal Effect
9%
Thermal Oxidation
9%
Valence Band
11%
Vapor Deposition
11%
Keyphrases
Adatoms
15%
Atomic Beams
9%
Au Colloids
9%
Band Gap Tuning
9%
BiFeO3
9%
Buffer Structure
9%
Buffer Technique
11%
Clustering Phenomena
9%
Cobalt Nanoclusters
9%
CuO Nanowires
9%
Dilute Nitrides
9%
Dual Cocatalysts
9%
Epitaxial Film
13%
Graphene
9%
Hydrogenated Graphene
9%
InN Films
9%
Light Emitting Properties
9%
Metallic Clusters
9%
Microspectroscopy
9%
Monodisperse
9%
Nanowire Sensors
9%
Nitrides
9%
Nitrogen Plasma
10%
NiWO4
9%
Photoelectrochemical Performance
9%
Photoluminescence Measurements
9%
Photoluminescence Studies
9%
Piezoelectric Potential
9%
Polar Plane
9%
Relative Shift
9%
Room Temperature
9%
Semiconductor Nanorods
9%
Si(111)
27%
Single Bend
9%
Spectroscopic Ellipsometry
18%
Spontaneous Order
12%
Supporting Substrate
9%
Thermal Nitridation
12%
Thermal Oxidation
9%
Thermal Oxidation Method
9%
Ti Catalyst
9%
Transferred Contacts
9%
Ultrathin Films
9%
UV Characteristics
9%
Visible-light-driven Photocatalyst
9%
White Light Application
9%
Wurtzite InN
27%
Wurtzite Type
12%
ZnO Microwire
9%
ZnO Rods
9%
