• 2202 引文
  • 27 h-指數
1983 …2019
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研究成果 1983 2019

A Bin Allocation Method for Applying Point Light in Linear Light Source

貢獻的翻譯標題: 點光源應用於線型燈源之料號配量方法Cheng, F-T., 1800, 專利號 ZL201310180988.X

研究成果: Patent

42 引文 (Scopus)

Accuracy and real-time considerations for implementing various virtual metrology algorithms

Su, Y. C., Lin, T. H., Cheng, F-T. & Wu, W. M., 2008 八月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 21, 3, p. 426-434 9 p., 4589025.

研究成果: Article

metrology
Process control
wafers
requirements
Recurrent neural networks
2 引文 (Scopus)

A Cloud-based Pluggable Manufacturing Service Scheme for Smart Factory

Liu, Y. Y., Hung, M. H., Lin, Y. C., Chen, C. C., Gao, W. L. & Cheng, F. T., 2018 十二月 4, 2018 IEEE 14th International Conference on Automation Science and Engineering, CASE 2018. IEEE Computer Society, p. 1040-1045 6 p. 8560401. (IEEE International Conference on Automation Science and Engineering; 卷 2018-August).

研究成果: Conference contribution

Industrial plants
Pulse amplitude modulation
Plasma enhanced chemical vapor deposition
Cloud computing
Graphical user interfaces
2 引文 (Scopus)
Wear of materials
Neural networks
Industrial plants
Logistics
Machining

A dual-forecast scheme for production output with paired/unpaired WIP data

Yang, H. C., Tsai, T. H., Chao, C. Y., Hung, M. H. & Cheng, F. T., 2012 十二月 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 581-586 6 p. 6386467. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Production control
Outsourcing
Supply chains
Semiconductor materials
Control systems
6 引文 (Scopus)
Liquid crystal displays
Industrial plants
Color
12 引文 (Scopus)

Advanced E-manufacturing model: The significance of large-scale, distributed, and object-oriented systems

Cheng, F-T., Tsai, W. H., Wang, T. L., Yung-Cheng Chang, J. & Su, Y. C., 2010 三月 1, 於 : IEEE Robotics and Automation Magazine. 17, 1, p. 71-84 14 p., 5430394.

研究成果: Article

Productivity
Production platforms
Decision making
Semiconductor materials
Industry

ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX

貢獻的翻譯標題: 應用具信心指標之虛擬量測的先進製程控制機制Cheng, F-T., 2012 二月 16, 專利號 特許5292602

研究成果: Patent

Process control
Control systems
Feedback
Controllers
Processing

ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX

貢獻的翻譯標題: 使用具有信心指標的虛擬量測的先進工藝控制系統與方法Cheng, F-T., 2012 三月 14, 專利號 1205265

研究成果: Patent

ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX

貢獻的翻譯標題: 應用具信心指標之虛擬量測的先進製程控制機制Cheng, F-T., 2012 二月 10, 專利號 10-1335896

研究成果: Patent

Process control
Control systems
Gain control
Patents and inventions
Merging

ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX

貢獻的翻譯標題: 應用具信心指標之虛擬量測的先進製程控制機制Cheng, F-T., 2012 二月 2, 專利號 8688256

研究成果: Patent

Process control
Control systems
Controllers
Gaging
Patents and inventions

ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX AND COMPUTER PROGRAM PRODUCT THEREOF

貢獻的翻譯標題: 使用具有信心指標之虛擬量測的先進製程控制系統與方法及其電腦程式產品Cheng, F-T., 1800, 專利號 I427722

研究成果: Patent

Advanced studies of selection schemes for dual virtual-metrology outputs

Wu, W. M., Cheng, F-T., Lin, T. H., Zeng, D. L., Chen, J. F. & Hung, M. H., 2009 十一月 12, 2009 IEEE International Conference on Automation Science and Engineering, CASE 2009. p. 421-426 6 p. 5234137. (2009 IEEE International Conference on Automation Science and Engineering, CASE 2009).

研究成果: Conference contribution

Neural networks
Liquid crystal displays
Backpropagation
Chemical vapor deposition
12 引文 (Scopus)
Communication
Automatic guided vehicles
Wireless networks
Servers
Inspection

A generic software testing system and method

貢獻的翻譯標題: 通用型軟體測試系統與方法Cheng, F-T., 1800, 專利號 I262383

研究成果: Patent

A Gradual Refreshing Scheme for Improving Tool Utilization

Yang, H. C., Tsai, T. H., Tieng, H. & Cheng, F. T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 515-522 8 p., 8605344.

研究成果: Article

Machining
Availability
Modeling
Model
Coating
6 引文 (Scopus)

A holonic information exchange system for e-Manufacturing

Cheng, F-T. & Lin, C. T., 2004 十二月 1, p. 2377-2382. 6 p.

研究成果: Paper

Industry
Seizing
Data warehouses
Enterprise resource planning
Communication
3 引文 (Scopus)

A hybrid tool life prediction scheme in cloud architecture

Yang, H. C., Li, Y. Y., Wu, M. N. & Cheng, F. T., 2016 十一月 14, 2016 IEEE International Conference on Automation Science and Engineering, CASE 2016. IEEE Computer Society, p. 1160-1165 6 p. 7743536. (IEEE International Conference on Automation Science and Engineering; 卷 2016-November).

研究成果: Conference contribution

Wear of materials
Industrial plants
Neural networks

A key parameter analysis-and-selection system "eProcessKey"

Kao, C. A., Cheng, C. H. & Cheng, F-T., 2012 十二月 20, 2012 e-Manufacturing and Design Collaboration Symposium, eMDC 2012. 6338423. (2012 e-Manufacturing and Design Collaboration Symposium, eMDC 2012).

研究成果: Conference contribution

Design of experiments
Engineers
2 引文 (Scopus)

A multi-objective optimization approach for selecting key features of machining processes

Tieng, H., Yang, H. C., Hung, M. H. & Cheng, F. T., 2014 一月 1, 於 : IEEE International Conference on Automation Science and Engineering. 2014-January, p. 899-904 6 p., 6899432.

研究成果: Conference article

Multiobjective optimization
Machining
Sorting
Genetic algorithms
Wheels
2 引文 (Scopus)
Manipulators
Industrial robots
1 引文 (Scopus)

Analysis and resolution of singularities for a 5-DOF GRYPHON manipulator

Cheng, F-T., Hour, T. L., Sun, Y. Y. & Kung, F. C., 1995 三月 1, 於 : Journal of Control Systems and Technology. 3, 1, p. 1-13 13 p.

研究成果: Article

Manipulators
Industrial robots
2 引文 (Scopus)

An e-diagnostics framework with security considerations for semiconductor factories

Hung, M. H., Ho, R. W. & Cheng, F. T., 2004 十二月 1, 2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW. p. 37-40 4 p. (2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW).

研究成果: Conference contribution

XML
Industrial plants
Semiconductor materials
Security systems
Information management
4 引文 (Scopus)

An efficient data exchange scheme for semiconductor engineering chain management system

Hunga, M. H., Wu, S. W., Wang, T. L., Cheng, F-T. & Feng, Y. Y., 2010 一月 1, 於 : Robotics and Computer-Integrated Manufacturing. 26, 5, p. 507-516 10 p.

研究成果: Article

Data Exchange
Electronic data interchange
Semiconductors
Semiconductor materials
Engineering
4 引文 (Scopus)
Point contacts
Linear equations
Decomposition

An Intelligent Metrology Architecture with AVM for Metal Additive Manufacturing

Yang, H. C., Adnan, M., Huang, C. H., Cheng, F-T., Lo, Y-L. & Hsu, C. H., 2019 七月 1, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2886-2893 8 p., 8733865.

研究成果: Article

3D printers
Metrology
Manufacturing
Metals
Module
11 引文 (Scopus)
Semiconductor Manufacturing
Semiconductor materials
Controller
Controllers
Communication

An optimal LED bin allocation system based on multi-level integer programming method

Yang, H. C., Tsai, T. H., Chen, H. W. & Cheng, F-T., 2012 一月 1, 2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012. IEEE Computer Society, p. 1223-1227 5 p. 6837938. (IEEE International Conference on Industrial Engineering and Engineering Management).

研究成果: Conference contribution

Integer programming
Bins
Light emitting diodes
Inventory control
Display devices
1 引文 (Scopus)

A Novel Automated Construction Scheme for Efficiently Developing Cloud Manufacturing Services

Chen, C. C., Hung, M. H., Li, P. Y., Lin, Y. C., Liu, Y. Y. & Cheng, F. T., 2018 七月 1, 於 : IEEE Robotics and Automation Letters. 3, 3, p. 1378-1385 8 p.

研究成果: Article

Manufacturing
Manufacturing Industries
Metrology
System Architecture
Work Flow
9 引文 (Scopus)

A novel automatic virtual metrology system architecture for TFT-LCD industry based on main memory database

Hung, M. H., Tsai, W. H., Yang, H. C., Kao, Y. J. & Cheng, F-T., 2012 八月 1, 於 : Robotics and Computer-Integrated Manufacturing. 28, 4, p. 559-568 10 p.

研究成果: Article

Metrology
System Architecture
Liquid crystal displays
Industry
Data storage equipment
9 引文 (Scopus)
Machining
Machine tools
Industry
Ontology
Cutting tools

A Novel Efficient Big Data Processing Scheme for Feature Extraction in Electrical Discharge Machining

Chen, C. C., Hung, M. H., Suryajaya, B., Lin, Y. C., Yang, H. C., Huang, H. C. & Cheng, F. T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 910-917 8 p., 8605347.

研究成果: Article

Electric discharge machining
Machining
Feature Extraction
Feature extraction
Electric sparks
Factory automation
Ethernet
Control equipment
Network layers
Information management
5 引文 (Scopus)

A novel key-variable sifting algorithm for virtual metrology

Lin, T. H., Cheng, F-T., Ye, A. J., Wu, W. M. & Hung, M. H., 2008 九月 18, 2008 IEEE International Conference on Robotics and Automation, ICRA 2008. p. 3636-3641 6 p. 4543768. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Neural networks
Recurrent neural networks
Backpropagation
Etching
Semiconductor materials
Redundant manipulators
Redundancy
Inverse kinematics
Manipulators
75 引文 (Scopus)

A novel virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing

Hung, M. H., Lin, T. H., Cheng, F-T. & Lin, R. C., 2007 六月 1, 於 : IEEE/ASME Transactions on Mechatronics. 12, 3, p. 308-316 9 p.

研究成果: Article

Chemical vapor deposition
Semiconductor materials
Neural networks
Backpropagation
Defects
12 引文 (Scopus)

A novel virtual metrology scheme for predicting machining precision of machine tools

Tieng, H., Yang, H. C., Hung, M. H. & Cheng, F. T., 2013 十一月 14, 2013 IEEE International Conference on Robotics and Automation, ICRA 2013. p. 264-269 6 p. 6630586. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Machine tools
Machining
Machining centers
Feature extraction
Inspection
7 引文 (Scopus)

Application cluster service scheme for near-zero-downtime services

Cheng, F-T., Wu, S. L., Tsai, P. Y., Chung, Y. T. & Yang, H. C., 2005 十二月 1, Proceedings of the 2005 IEEE International Conference on Robotics and Automation. p. 4062-4067 6 p. 1570743. (Proceedings - IEEE International Conference on Robotics and Automation; 卷 2005).

研究成果: Conference contribution

Recovery
Distributed computer systems
Computer system recovery
Degradation
52 引文 (Scopus)

Application development of virtual metrology in semiconductor industry

Jonathan, C. Y. C. & Cheng, F-T., 2005 十二月 1, IECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society. p. 124-129 6 p. 1568891. (IECON Proceedings (Industrial Electronics Conference); 卷 2005).

研究成果: Conference contribution

Semiconductor materials
Industry
Quality assurance
Foundries
Data acquisition
7 引文 (Scopus)
Plasma enhanced chemical vapor deposition
Solar cells
Inspection
Sampling
Feedback
48 引文 (Scopus)

A processing quality prognostics scheme for plasma sputtering in TFT-LCD manufacturing

Su, Y. C., Hung, M. H., Cheng, F-T. & Chen, Y. T., 2006 五月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 19, 2, p. 183-193 11 p.

研究成果: Article

Liquid crystal displays
Sputtering
manufacturing
sputtering
Plasmas
4 引文 (Scopus)

A quality prognostics scheme for semiconductor and TFT-LCD manufacturing processes

Su, Y. C., Cheng, F. T., Huang, G. W., Hung, M. H. & Yang, T., 2004 十二月 1, p. 1972-1977. 6 p.

研究成果: Paper

Liquid crystal displays
Semiconductor materials
Artificial intelligence
Physics
Statistics
5 引文 (Scopus)

A scheme of high-dimensional key-variable search algorithms for yield improvement

Cheng, F. T., Hsieh, Y. S., Zheng, J. W., Chen, S. M., Xiao, R. X. & Lin, C. Y., 2017 一月 1, 於 : IEEE Robotics and Automation Letters. 2, 1, p. 179-186 8 p., 7498656.

研究成果: Article

Search Algorithm
High-dimensional
Roots
Thin-film Transistor
Liquid Crystal Display

A secure collaborative e-Diagnostics framework for semiconductor factories

Hung, M. H., Hsu, F. Y., Wang, T. L., Cheng, F-T., Lai, R. & Huang, T., 2005 十二月 1, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. p. 185-190 6 p. 1506766. (Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005; 卷 2005).

研究成果: Conference contribution

Industrial plants
Availability
Semiconductor materials
Security of data
Web services
1 引文 (Scopus)
Recovery
Distributed computer systems
Computer system recovery
Software architecture
Availability
1 引文 (Scopus)

Automated sampling decision scheme for the AVM system

Cheng, F. T., Hsieh, Y. S., Chen, C. F. & Lyu, J. R., 2016 十一月 1, 於 : International Journal of Production Research. 54, 21, p. 6351-6366 16 p.

研究成果: Article

Sampling
Industrial plants
1 引文 (Scopus)

Automatic baseline-sample-selection scheme for baseline predictive maintenance

Chen, C. F., Hsieh, Y. S., Cheng, F. T., Huang, H. C. & Wang, S. C., 2013 十二月 1, 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013. p. 183-188 6 p. 6653934. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Failure analysis
Health
30 引文 (Scopus)

Automatic data quality evaluation for the AVM system

Huang, Y. T. & Cheng, F. T., 2011 八月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 24, 3, p. 445-454 10 p., 5766761.

研究成果: Article

metrology
evaluation
Thin film transistors
Liquid crystal displays
Principal component analysis
1 引文 (Scopus)

Automatic Virtual Metrology and Deformation Fusion Scheme for Engine-Case Manufacturing

Tieng, H., Tsai, T. H., Chen, C. F., Yang, H. C., Huang, J. W. & Cheng, F. T., 2018 四月 1, 於 : IEEE Robotics and Automation Letters. 3, 2, p. 934-941 8 p., 8255616.

研究成果: Article

Metrology
Fusion
Engine
Fusion reactions
Manufacturing
4 引文 (Scopus)

Automatic Virtual Metrology and Target Value Adjustment for Mass Customization

Tieng, H., Chen, C. F., Cheng, F. T. & Yang, H. C., 2017 四月 1, 於 : IEEE Robotics and Automation Letters. 2, 2, p. 546-553 8 p., 7801027.

研究成果: Article

Mass Customization
Metrology
Wheels
Adjustment
Wheel