• 2181 引文
  • 26 h-指數
1983 …2019
如果您對這些純文本內容做了任何改變,很快就會看到。

研究成果 1983 2019

篩選
Conference contribution
2018
2 引文 (Scopus)

A Cloud-based Pluggable Manufacturing Service Scheme for Smart Factory

Liu, Y. Y., Hung, M. H., Lin, Y. C., Chen, C-C., Gao, W. L. & Cheng, F-T., 2018 十二月 4, 2018 IEEE 14th International Conference on Automation Science and Engineering, CASE 2018. IEEE Computer Society, p. 1040-1045 6 p. 8560401. (IEEE International Conference on Automation Science and Engineering; 卷 2018-August).

研究成果: Conference contribution

Industrial plants
Pulse amplitude modulation
Plasma enhanced chemical vapor deposition
Cloud computing
Graphical user interfaces
2016
3 引文 (Scopus)

A hybrid tool life prediction scheme in cloud architecture

Yang, H. C., Li, Y. Y., Wu, M. N. & Cheng, F-T., 2016 十一月 14, 2016 IEEE International Conference on Automation Science and Engineering, CASE 2016. IEEE Computer Society, p. 1160-1165 6 p. 7743536. (IEEE International Conference on Automation Science and Engineering; 卷 2016-November).

研究成果: Conference contribution

Wear of materials
Industrial plants
Neural networks
2015

Development of a novel cloud-based multi-tenant model creation scheme for machine tools

Lin, Y. C., Hung, M. H., Wei, C. F. & Cheng, F-T., 2015 十月 7, 2015 IEEE Conference on Automation Science and Engineering: Automation for a Sustainable Future, CASE 2015. IEEE Computer Society, p. 1448-1449 2 p. 7294302. (IEEE International Conference on Automation Science and Engineering; 卷 2015-October).

研究成果: Conference contribution

Machine tools
Costs

Extracting relevant features for diagnosing machine tool faults in cloud architecture

Li, Y. Y., Yang, H. C., Tieng, H. & Cheng, F-T., 2015 十月 7, 2015 IEEE Conference on Automation Science and Engineering: Automation for a Sustainable Future, CASE 2015. IEEE Computer Society, p. 1434-1439 6 p. 7294299. (IEEE International Conference on Automation Science and Engineering; 卷 2015-October).

研究成果: Conference contribution

Machine tools
Process monitoring
Sorting
Genetic algorithms

Total precision inspection of machine tools with virtual metrology

Tieng, H., Yang, H. C. & Cheng, F-T., 2015 十月 7, 2015 IEEE Conference on Automation Science and Engineering: Automation for a Sustainable Future, CASE 2015. IEEE Computer Society, p. 1446-1447 2 p. 7294301. (IEEE International Conference on Automation Science and Engineering; 卷 2015-October).

研究成果: Conference contribution

Machine tools
Machining
Inspection
Sensors
Signal to noise ratio
2013
12 引文 (Scopus)

A novel virtual metrology scheme for predicting machining precision of machine tools

Tieng, H., Yang, H. C., Hung, M. H. & Cheng, F-T., 2013 十一月 14, 2013 IEEE International Conference on Robotics and Automation, ICRA 2013. p. 264-269 6 p. 6630586. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Machine tools
Machining
Machining centers
Feature extraction
Inspection
1 引文 (Scopus)

Automatic baseline-sample-selection scheme for baseline predictive maintenance

Chen, C. F., Hsieh, Y. S., Cheng, F-T., Huang, H. C. & Wang, S. C., 2013, 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013. p. 183-188 6 p. 6653934

研究成果: Conference contribution

Failure analysis
Health
10 引文 (Scopus)

Development of an advanced manufacturing cloud for machine tool industry based on AVM technology

Hung, M. H., Lin, Y. C., Huang, H. C., Hsieh, M. H., Yang, H. C. & Cheng, F. T., 2013 十二月 1, 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013. p. 189-194 6 p. 6654048. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Machine tools
Industry
Industrial plants

Preliminary study of advanced fault detection scheme

Shih, Y. H., Huang, Y. T. & Cheng, F-T., 2013 十一月 14, 2013 IEEE International Conference on Robotics and Automation, ICRA 2013. p. 3561-3566 6 p. 6631076. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Fault detection
Failure modes
Sampling
Support vector machines
Managers
2012

A dual-forecast scheme for production output with paired/unpaired WIP data

Yang, H. C., Tsai, T. H., Chao, C. Y., Hung, M. H. & Cheng, F-T., 2012 十二月 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 581-586 6 p. 6386467. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Production control
Outsourcing
Supply chains
Semiconductor materials
Control systems

A key parameter analysis-and-selection system "eProcessKey"

Kao, C. A., Cheng, C. H. & Cheng, F-T., 2012 十二月 20, 2012 e-Manufacturing and Design Collaboration Symposium, eMDC 2012. 6338423. (2012 e-Manufacturing and Design Collaboration Symposium, eMDC 2012).

研究成果: Conference contribution

Design of experiments
Engineers

An optimal LED bin allocation system based on multi-level integer programming method

Yang, H. C., Tsai, T. H., Chen, H. W. & Cheng, F-T., 2012 一月 1, 2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012. IEEE Computer Society, p. 1223-1227 5 p. 6837938. (IEEE International Conference on Industrial Engineering and Engineering Management).

研究成果: Conference contribution

Integer programming
Bins
Light emitting diodes
Inventory control
Display devices

A virtual-metrology-based machining state conjecture system

Yang, H. C., Tieng, H., Li, Y. Y., Hung, M. H. & Cheng, F-T., 2012 十月 5, AIM 2012 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Conference Digest. p. 462-466 5 p. 6265901. (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM).

研究成果: Conference contribution

Machining
Controllers
Genetic algorithms
Control systems
12 引文 (Scopus)

Development of a cloud-computing-based equipment monitoring system for machine tool industry

Hung, M. H., Lin, Y. C., Quoc Huy, T., Yang, H. C. & Cheng, F-T., 2012 十二月 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 962-967 6 p. 6386500. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Cloud computing
Machine tools
Graphical user interfaces
Monitoring
Industry
1 引文 (Scopus)

New remote monitoring and control system architectures based on cloud computing

Cheng, J. Y., Hung, M. H., Lin, S. S. & Cheng, F-T., 2012 十一月 26, Advanced Manufacturing Focusing on Multi-Disciplinary Technologies. p. 312-329 18 p. (Advanced Materials Research; 卷 579).

研究成果: Conference contribution

Cloud computing
Control systems
Monitoring
Zigbee
Managers
1 引文 (Scopus)

Preliminary study of a dynamic-moving-window scheme for virtual-metrology model refreshing

Wu, W. M., Cheng, F-T. & Hung, M. H., 2012 一月 1, 2012 IEEE International Conference on Robotics and Automation, ICRA 2012. Institute of Electrical and Electronics Engineers Inc., p. 5044-5049 6 p. 6224633. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Design of experiments

Refinement of kernel and functional mechanisms for automatic virtual metrology system

Hung, M. H., Chen, C. F., Lin, Y. C., Chou, M. Y. & Cheng, F-T., 2012, AIM 2012 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Conference Digest. p. 472-477 6 p. 6265954

研究成果: Conference contribution

Managers
Liquid crystal displays
Communication
Testing
Industry
1 引文 (Scopus)

Virtual-metrology-based FDC scheme

Hsieh, Y. S., Cheng, F-T. & Yang, H. C., 2012 十二月 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 80-85 6 p. 6386371. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Fault detection
Statistical process control
Failure analysis
Monitoring
2011
8 引文 (Scopus)

Preliminary study of run-to-run control utilizing virtual metrology with reliance index

Kao, C. A., Cheng, F-T. & Wu, W. M., 2011 十二月 5, 2011 IEEE International Conference on Automation Science and Engineering, CASE 2011. p. 256-261 6 p. 6042446. (IEEE International Conference on Automation Science and Engineering).

研究成果: Conference contribution

Feedback
Gages
Process control
Semiconductor materials
4 引文 (Scopus)

Run-to-run control utilizing the AVM system in the solar industry

Lin, L. R., Chiu, Y. C., Mo, W. C., Kao, C. A., Liu, T. M., Zeng, D. L. & Cheng, F-T., 2011 十二月 22, 2011 e-Manufacturing and Design Collaboration Symposium and International Symposium on Semiconductor Manufacturing, eMDC and ISSM 2011. 6086044. (IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings).

研究成果: Conference contribution

Industry
Plasma enhanced chemical vapor deposition
Feedback
Gages
Solar cells
2010
3 引文 (Scopus)

Configuring AVM as a MES componConfiguring AVM as a MES component

Cheng, F-T., Chang, J. Y. C., Kao, C. A., Chen, Y. L. & Peng, J. L., 2010 十月 11, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2010. p. 226-231 6 p. 5551454. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings).

研究成果: Conference contribution

Inspection
Semiconductor materials
Sampling
Monitoring
Process monitoring
2 引文 (Scopus)

Developing a dual-stage indirect virtual metrology architecture

Tsai, W. H., Cheng, F-T., Wu, W. M. & Lin, T. H., 2010 八月 26, 2010 IEEE International Conference on Robotics and Automation, ICRA 2010. p. 2107-2112 6 p. 5509719. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Processing
Liquid crystal displays
Optoelectronic devices
Chemical vapor deposition
Industry
6 引文 (Scopus)

Development of an automatic virtual metrology framework for TFT-LCD industry

Hung, M. H., Huang, H. C., Yang, H. C. & Cheng, F-T., 2010 十一月 17, 2010 IEEE International Conference on Automation Science and Engineering, CASE 2010. p. 879-884 6 p. 5584541. (2010 IEEE International Conference on Automation Science and Engineering, CASE 2010).

研究成果: Conference contribution

Liquid crystal displays
Industry
Graphical user interfaces
Interfaces (computer)
Industrial plants
4 引文 (Scopus)

Virtual production control system

Yang, H. C., Chen, Y. L., Hung, M. H. & Cheng, F-T., 2010 十一月 17, 2010 IEEE International Conference on Automation Science and Engineering, CASE 2010. p. 984-989 6 p. 5584297. (2010 IEEE International Conference on Automation Science and Engineering, CASE 2010).

研究成果: Conference contribution

Production control
Control systems
Integer programming
Petri nets
Monitoring
2009

Advanced studies of selection schemes for dual virtual-metrology outputs

Wu, W. M., Cheng, F-T., Lin, T. H., Zeng, D. L., Chen, J. F. & Hung, M. H., 2009 十一月 12, 2009 IEEE International Conference on Automation Science and Engineering, CASE 2009. p. 421-426 6 p. 5234137. (2009 IEEE International Conference on Automation Science and Engineering, CASE 2009).

研究成果: Conference contribution

Neural networks
Liquid crystal displays
Backpropagation
Chemical vapor deposition
8 引文 (Scopus)

Developing a product quality fault detection scheme

Huang, Y. T., Cheng, F. T. & Hung, M. H., 2009 十一月 2, 2009 IEEE International Conference on Robotics and Automation, ICRA '09. p. 927-932 6 p. 5152474. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Fault detection
Sampling
Liquid crystal displays
Industrial plants
Servers
2008
5 引文 (Scopus)

A novel key-variable sifting algorithm for virtual metrology

Lin, T. H., Cheng, F-T., Ye, A. J., Wu, W. M. & Hung, M. H., 2008 九月 18, 2008 IEEE International Conference on Robotics and Automation, ICRA 2008. p. 3636-3641 6 p. 4543768. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Neural networks
Recurrent neural networks
Backpropagation
Etching
Semiconductor materials
10 引文 (Scopus)

Automatic virtual metrology system design and implementation

Huang, Y. T., Huang, H. C., Cheng, F-T., Liao, T. S. & Chang, F. C., 2008 十一月 3, 4th IEEE Conference on Automation Science and Engineering, CASE 2008. p. 223-229 7 p. 4626524. (4th IEEE Conference on Automation Science and Engineering, CASE 2008).

研究成果: Conference contribution

Systems analysis
Servers
Fans
5 引文 (Scopus)

Developing a selection scheme for dual virtual-metrology outputs

Wu, W. M., Cheng, F-T., Zeng, D. L., Lin, T. H. & Chen, J. F., 2008 十一月 3, 4th IEEE Conference on Automation Science and Engineering, CASE 2008. p. 230-235 6 p. 4626525. (4th IEEE Conference on Automation Science and Engineering, CASE 2008).

研究成果: Conference contribution

Neural networks
Liquid crystal displays
Backpropagation
Chemical vapor deposition
1 引文 (Scopus)

Development of a dual-stage virtual metrology architecture for TFT-LCD manufacturing

Su, Y. C., Tsai, W. H., Cheng, F-T. & Wu, W. M., 2008 九月 18, 2008 IEEE International Conference on Robotics and Automation, ICRA 2008. p. 3630-3635 6 p. 4543767. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Thin film transistors
Liquid crystal displays
Processing
Chemical vapor deposition
2007
1 引文 (Scopus)

Development of a dual-phase virtual metrology scheme

Cheng, F-T., Huang, H. C. & Kao, C. A., 2007 十二月 1, Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007. p. 270-275 6 p. 4341679. (Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007).

研究成果: Conference contribution

Liquid crystal displays
Glass
Semiconductor materials
Gages
Process control
14 引文 (Scopus)

Development of a generic virtual metrology framework

Huang, H. C., Su, Y. C., Cheng, F-T. & Jian, J. M., 2007, Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007. p. 282-287 6 p. 4341746

研究成果: Conference contribution

Process control
7 引文 (Scopus)

Implementation considerations of various virtual metrology algorithms

Su, Y. C., Lin, T. H., Cheng, F-T. & Wu, W. M., 2007, Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007. p. 276-281 6 p. 4341740

研究成果: Conference contribution

Process control
Recurrent neural networks
Liquid crystal displays
Backpropagation
Semiconductor materials
8 引文 (Scopus)

Method for evaluating reliance level of a virtual metrology system

Cheng, F-T., Chen, Y. T., Su, Y. C. & Zeng, D. L., 2007, 2007 IEEE International Conference on Robotics and Automation, ICRA'07. p. 1590-1596 7 p. 4209315

研究成果: Conference contribution

Semiconductor materials
Gaging
Foundries
Liquid crystal displays
4 引文 (Scopus)

Novel semiconductor business model - Engineering chain for the semiconductor industry

Chang, J. Y. C., Cheng, F-T. & Wang, T. L., 2007 十一月 27, 2007 IEEE International Conference on Robotics and Automation, ICRA'07. p. 1597-1602 6 p. 4209316. (Proceedings - IEEE International Conference on Robotics and Automation).

研究成果: Conference contribution

Semiconductor materials
Industry
Foundries
Consumer products
Integrated circuit design
2006
24 引文 (Scopus)

A virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing

Lin, T. H., Hung, M. H., Lin, R. C. & Cheng, F-T., 2006 十二月 27, Proceedings 2006 IEEE International Conference on Robotics and Automation, ICRA 2006. p. 1054-1059 6 p. 1641849. (Proceedings - IEEE International Conference on Robotics and Automation; 卷 2006).

研究成果: Conference contribution

Chemical vapor deposition
Semiconductor materials
Neural networks
Monitoring
Defects
15 引文 (Scopus)

Importance of data quality in virtual metrology

Huang, Y. T., Cheng, F-T. & Chen, Y. T., 2006 十二月 1, IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics. p. 3727-3732 6 p. 4153229. (IECON Proceedings (Industrial Electronics Conference)).

研究成果: Conference contribution

Chemical vapor deposition
Cleaning
Data reduction
Semiconductor materials
Defects
3 引文 (Scopus)

Manufacturability of multivariate applications in the semiconductor industry

Jonathan, C. Y. C. & Cheng, F-T., 2006 一月 1, 2006 IEEE International Conference on Automation Science and Engineering, CASE. Institute of Electrical and Electronics Engineers Inc., p. 230-235 6 p. 4120351. (2006 IEEE International Conference on Automation Science and Engineering, CASE).

研究成果: Conference contribution

Semiconductor materials
Industry
Fault detection
Productivity
Control equipment
15 引文 (Scopus)

Multivariate simulation assessment for virtual metrology

Chen, Y. T., Yang, H. C. & Cheng, F-T., 2006 十二月 27, Proceedings 2006 IEEE International Conference on Robotics and Automation, ICRA 2006. p. 1048-1053 6 p. 1641848. (Proceedings - IEEE International Conference on Robotics and Automation; 卷 2006).

研究成果: Conference contribution

Probability distributions
Sensitivity analysis
Neural networks
Costs
Monte Carlo simulation
2005
7 引文 (Scopus)

Application cluster service scheme for near-zero-downtime services

Cheng, F-T., Wu, S. L., Tsai, P. Y., Chung, Y. T. & Yang, H. C., 2005 十二月 1, Proceedings of the 2005 IEEE International Conference on Robotics and Automation. p. 4062-4067 6 p. 1570743. (Proceedings - IEEE International Conference on Robotics and Automation; 卷 2005).

研究成果: Conference contribution

Recovery
Distributed computer systems
Computer system recovery
Degradation
51 引文 (Scopus)

Application development of virtual metrology in semiconductor industry

Jonathan, C. Y. C. & Cheng, F-T., 2005 十二月 1, IECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society. p. 124-129 6 p. 1568891. (IECON Proceedings (Industrial Electronics Conference); 卷 2005).

研究成果: Conference contribution

Semiconductor materials
Industry
Quality assurance
Foundries
Data acquisition

A secure collaborative e-Diagnostics framework for semiconductor factories

Hung, M. H., Hsu, F. Y., Wang, T. L., Cheng, F-T., Lai, R. & Huang, T., 2005 十二月 1, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. p. 185-190 6 p. 1506766. (Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005; 卷 2005).

研究成果: Conference contribution

Industrial plants
Availability
Semiconductor materials
Security of data
Web services
2 引文 (Scopus)

Design and implementation of an intelligent prognostics system

Su, Y. C., Cheng, F-T., Hung, M. H., Lin, Y. C. & Lin, R. C., 2005, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. 卷 2005. p. 273-278 6 p. 1506781

研究成果: Conference contribution

Intelligent systems
Liquid crystal displays
Industrial plants
Semiconductor materials
Maintainability

Development of a data pre-processing scheme and pluggable application modules for an intelligent equipment prognostics system

Su, Y. C., Hung, M. H., Cheng, F-T. & Lee, T. P., 2005 十二月 1, Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. p. 38-43 6 p. 1560349. (2005 3rd IEEE International Conference on Industrial Informatics, INDIN; 卷 2005).

研究成果: Conference contribution

Processing
Pulse amplitude modulation
Graphical user interfaces
Liquid crystal displays
User interfaces
5 引文 (Scopus)

Engineering-chain requirements for semiconductor industry

Cheng, J. C. Y. & Cheng, F-T., 2005 十二月 1, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. p. 381-386 6 p. 1506799. (Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005; 卷 2005).

研究成果: Conference contribution

Semiconductor materials
Industry
Microelectronics
Foundries
Electronic data interchange
5 引文 (Scopus)

Framework development of an engineering-chain-management-system for the semiconductor industry

Chang, J. Y. C. & Cheng, F. T., 2005 十二月 1, Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. p. 306-311 6 p. 1560394. (2005 3rd IEEE International Conference on Industrial Informatics, INDIN; 卷 2005).

研究成果: Conference contribution

Semiconductor materials
Industry
Foundries
Microelectronics
Supply chains
2004
2 引文 (Scopus)

An e-diagnostics framework with security considerations for semiconductor factories

Hung, M. H., Ho, R. W. & Cheng, F-T., 2004 十二月 1, 2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW. p. 37-40 4 p. (2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW).

研究成果: Conference contribution

XML
Industrial plants
Semiconductor materials
Security systems
Information management
1999
12 引文 (Scopus)

Development of a generic equipment manager for semiconductor manufacturing

Yang, H. C., Cheng, F-T. & Huang, D., 1999, IEEE Symposium on Emerging Technologies and Factory Automation, ETFA. IEEE, 卷 1. p. 727-732 6 p.

研究成果: Conference contribution

Managers
Semiconductor materials
Reusability
Industry
Controllers
3 引文 (Scopus)

Development of an object-based equipment controller for semiconductor equipment communications

Deng, J. Y., Cheng, F-T. & Nguyen, K., 1999, IECON Proceedings (Industrial Electronics Conference). IEEE, 卷 3. p. 1240-1245 6 p.

研究成果: Conference contribution

Semiconductor materials
Controllers
Communication
Air cushion vehicles
Unified Modeling Language
1998
20 引文 (Scopus)

Development of a distributed object-oriented system framework for the computer-integrated manufacturing execution system

Cheng, F-T., Shen, E., Deng, J. Y. & Nguyen, K., 1998 一月 1, Proceedings - 1998 IEEE International Conference on Robotics and Automation, ICRA 1998. Institute of Electrical and Electronics Engineers Inc., p. 2116-2121 6 p. 680633. (Proceedings - IEEE International Conference on Robotics and Automation; 卷 3).

研究成果: Conference contribution

Computer integrated manufacturing
Common object request broker architecture (CORBA)
Fruits
Automation