• 2181 引文
  • 26 h-指數
1983 …2019
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研究成果 1983 2019

篩選
Article
2019

A Gradual Refreshing Scheme for Improving Tool Utilization

Yang, H. C., Tsai, T. H., Tieng, H. & Cheng, F-T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 515-522 8 p., 8605344.

研究成果: Article

Machining
Availability
Modeling
Model
Coating

An Intelligent Metrology Architecture with AVM for Metal Additive Manufacturing

Yang, H. C., Adnan, M., Huang, C. H., Cheng, F-T., Lo, Y-L. & Hsu, C. H., 2019 七月 1, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2886-2893 8 p., 8733865.

研究成果: Article

3D printers
Metrology
Manufacturing
Metals
Module

A Novel Efficient Big Data Processing Scheme for Feature Extraction in Electrical Discharge Machining

Chen, C-C., Hung, M. H., Suryajaya, B., Lin, Y. C., Yang, H. C., Huang, H. C. & Cheng, F-T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 910-917 8 p., 8605347.

研究成果: Article

Electric discharge machining
Machining
Feature Extraction
Feature extraction
Electric sparks

Automatic Virtual Metrology for Carbon Fiber Manufacturing

Hsieh, Y. M., Lin, C. Y., Yang, Y. R., Hung, M. H. & Cheng, F-T., 2019 七月 1, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2730-2737 8 p., 8716511.

研究成果: Article

Carbon Fiber
Metrology
Carbon fibers
Manufacturing
Inspection

Time Series Prediction Algorithm for Intelligent Predictive Maintenance

Lin, C. Y., Hsieh, Y. M., Cheng, F-T., Huang, H. C. & Adnan, M., 2019 七月 1, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2807-2814 8 p., 8721101.

研究成果: Article

Time Series Prediction
Time series
Maintenance
Target
Exponential Model
2018
1 引文 (Scopus)

A Novel Automated Construction Scheme for Efficiently Developing Cloud Manufacturing Services

Chen, C-C., Hung, M. H., Li, P. Y., Lin, Y. C., Liu, Y. Y. & Cheng, F-T., 2018 七月 1, 於 : IEEE Robotics and Automation Letters. 3, 3, p. 1378-1385 8 p.

研究成果: Article

Manufacturing
Manufacturing Industries
Metrology
System Architecture
Work Flow
1 引文 (Scopus)

Automatic Virtual Metrology and Deformation Fusion Scheme for Engine-Case Manufacturing

Tieng, H., Tsai, T. H., Chen, C. F., Yang, H. C., Huang, J. W. & Cheng, F-T., 2018 四月 1, 於 : IEEE Robotics and Automation Letters. 3, 2, p. 934-941 8 p., 8255616.

研究成果: Article

Metrology
Fusion
Engine
Fusion reactions
Manufacturing

Interaction-Effect Search Algorithm for the KSA Scheme

Lin, C. Y., Hsieh, Y. M., Cheng, F-T., Yang, Y. R. & Adnan, M., 2018 十月 1, 於 : IEEE Robotics and Automation Letters. 3, 4, p. 2778-2785 8 p.

研究成果: Article

Interaction Effects
Search Algorithm
Roots
Industry
Profitability
2017
2 引文 (Scopus)
Wear of materials
Neural networks
Industrial plants
Logistics
Machining
5 引文 (Scopus)

A scheme of high-dimensional key-variable search algorithms for yield improvement

Cheng, F-T., Hsieh, Y. S., Zheng, J. W., Chen, S. M., Xiao, R. X. & Lin, C. Y., 2017 一月 1, 於 : IEEE Robotics and Automation Letters. 2, 1, p. 179-186 8 p., 7498656.

研究成果: Article

Search Algorithm
High-dimensional
Roots
Thin-film Transistor
Liquid Crystal Display
4 引文 (Scopus)

Automatic Virtual Metrology and Target Value Adjustment for Mass Customization

Tieng, H., Chen, C. F., Cheng, F-T. & Yang, H. C., 2017 四月 1, 於 : IEEE Robotics and Automation Letters. 2, 2, p. 546-553 8 p., 7801027.

研究成果: Article

Mass Customization
Metrology
Wheels
Adjustment
Wheel
1 引文 (Scopus)

Blind-Stage Search Algorithm for the Key-Variable Search Scheme

Cheng, F-T., Lin, C. Y., Chen, C. F., Xiao, R. X., Zheng, J. W. & Hsieh, Y. S., 2017 十月 1, 於 : IEEE Robotics and Automation Letters. 2, 4, p. 1840-1847 8 p., 7934071.

研究成果: Article

Search Algorithm
Roots
Enhancement
Profitability
Defect density
6 引文 (Scopus)
Industrial plants
Industry
Health
Resource allocation
Productivity
26 引文 (Scopus)

Development of Advanced Manufacturing Cloud of Things (AMCoT)-A Smart Manufacturing Platform

Lin, Y. C., Hung, M. H., Huang, H. C., Chen, C-C., Yang, H. C., Hsieh, Y. S. & Cheng, F-T., 2017 七月 1, 於 : IEEE Robotics and Automation Letters. 2, 3, p. 1809-1816 8 p., 7932169.

研究成果: Article

Thing
Manufacturing
Internet of Things
Semiconductor Manufacturing
Manufacturing Industries
5 引文 (Scopus)

Development of a novel cloud-based multi-tenant model creation service for automatic virtual metrology

Hung, M. H., Li, Y. Y., Lin, Y. C., Wei, C. F., Yang, H. C. & Cheng, F-T., 2017 四月 1, 於 : Robotics and Computer-Integrated Manufacturing. 44, p. 174-189 16 p.

研究成果: Article

Multi-model
Metrology
Industrial plants
Model
Cloud computing
2016
9 引文 (Scopus)

A novel cloud manufacturing framework with auto-scaling capability for the machining industry

Chen, C-C., Lin, Y. C., Hung, M. H., Lin, C. Y., Tsai, Y. J. & Cheng, F-T., 2016 七月 2, 於 : International Journal of Computer Integrated Manufacturing. 29, 7, p. 786-804 19 p.

研究成果: Article

Machining
Machine tools
Industry
Ontology
Cutting tools
1 引文 (Scopus)

Automated sampling decision scheme for the AVM system

Cheng, F-T., Hsieh, Y. S., Chen, C. F. & Lyu, J. R., 2016 十一月 1, 於 : International Journal of Production Research. 54, 21, p. 6351-6366 16 p.

研究成果: Article

Sampling
Industrial plants
4 引文 (Scopus)

Automatic virtual metrology for wheel machining automation

Yang, H. C., Tieng, H. & Cheng, F-T., 2016 十一月 1, 於 : International Journal of Production Research. 54, 21, p. 6367-6377 11 p.

研究成果: Article

Wheels
Machining
Automation
Inspection
Machine tools

Industry 4.1 for Wheel Machining Automation

Cheng, F. T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Wheels
Machining
Automation
Industry
Defects

Industry 4.1 for Wheel Machining Automation

Cheng, F-T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Machining
Wheel
Automation
Wheels
Industry
16 引文 (Scopus)

Industry 4.1 for Wheel Machining Automation

Cheng, F-T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Machining
Wheel
Automation
Wheels
Industry
8 引文 (Scopus)
Machine tools
Inspection
Machining
Feature extraction
Cleaning
2015

CASE 2014 [Society News]

Luo, R. C. & Cheng, F-T., 2015 一月 1, 於 : IEEE Robotics and Automation Magazine. 22, 1, p. 130-131 2 p., 7059272.

研究成果: Article

Automation
Robotics
Industry
11 引文 (Scopus)

Development of cloud-based automatic virtual metrology system for semiconductor industry

Huang, H. C., Lin, Y. C., Hung, M. H., Tu, C. C. & Cheng, F-T., 2015 一月 1, 於 : Robotics and Computer-Integrated Manufacturing. 34, p. 30-43 14 p.

研究成果: Article

Metrology
Semiconductors
Industry
Semiconductor materials
Servers
5 引文 (Scopus)

Intelligent sampling decision scheme based on the AVM system

Cheng, F-T., Chen, C. F., Hsieh, Y. S., Huang, H. H. & Wu, C. C., 2015 四月 3, 於 : International Journal of Production Research. 53, 7, p. 2073-2088 16 p.

研究成果: Article

Sampling
Inspection
Monitoring
Costs
16 引文 (Scopus)

Tutorial on applying the VM technology for TFT-LCD manufacturing

Cheng, F-T., Kao, C. A., Chen, C. F. & Tsai, W. H., 2015 二月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 28, 1, p. 55-69 15 p., 6983605.

研究成果: Article

Thin film transistors
Liquid crystal displays
metrology
transistors
manufacturing
2014
5 引文 (Scopus)
Liquid crystal displays
Industrial plants
Color
2013
7 引文 (Scopus)
Plasma enhanced chemical vapor deposition
Solar cells
Inspection
Sampling
Feedback
16 引文 (Scopus)

Run-to-run control utilizing virtual metrology with reliance index

Kao, C. A., Cheng, F-T., Wu, W. M., Kong, F. W. & Huang, H. H., 2013 二月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 69-81 13 p., 6357325.

研究成果: Article

metrology
Feedback
Gages
maintenance
Process control
12 引文 (Scopus)

VM-based baseline predictive maintenance scheme

Hsieh, Y. S., Cheng, F-T., Huang, H. C., Wang, C. R., Wang, S. C. & Yang, H. C., 2013 二月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 132-144 13 p., 6304937.

研究成果: Article

maintenance
Failure analysis
prognosis
Degradation
metrology
2012
9 引文 (Scopus)

A novel automatic virtual metrology system architecture for TFT-LCD industry based on main memory database

Hung, M. H., Tsai, W. H., Yang, H. C., Kao, Y. J. & Cheng, F-T., 2012 八月 1, 於 : Robotics and Computer-Integrated Manufacturing. 28, 4, p. 559-568 10 p.

研究成果: Article

Metrology
System Architecture
Liquid crystal displays
Industry
Data storage equipment
1 引文 (Scopus)

Design and implementation of a data exchange platform for TFT-LCD virtual production control systems

Hung, M. H., Lin, Y. C., Li, S. H., Yang, H. C. & Cheng, F-T., 2012 一月 1, 於 : International Journal of Automation and Smart Technology. 2, 2, p. 83-94 12 p.

研究成果: Article

Production control
Electronic data interchange
Liquid crystal displays
Control systems
Planning
53 引文 (Scopus)

Developing an automatic virtual metrology system

Cheng, F-T., Huang, H. C. & Kao, C. A., 2012 一月 1, 於 : IEEE Transactions on Automation Science and Engineering. 9, 1, p. 181-188 8 p., 6051498.

研究成果: Article

Industrial plants
Semiconductor materials
Thin film transistors
Liquid crystal displays
Optoelectronic devices
9 引文 (Scopus)

Development of an AVM System Implementation Framework

Hung, M. H., Chen, C. F., Huang, H. C., Yang, H. C. & Cheng, F-T., 2012 一月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 4, p. 598-613 16 p.

研究成果: Article

metrology
industrial plants
Industrial plants
Thin film transistors
Liquid crystal displays
13 引文 (Scopus)

Dynamic-moving-window scheme for virtual-metrology model refreshing

Wu, W. M., Cheng, F-T. & Kong, F. W., 2012 五月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 2, p. 238-246 9 p., 6126059.

研究成果: Article

metrology
experiment design
predictions
Design of experiments
resources
4 引文 (Scopus)

Engineering chain: A novel semiconductor engineering collaboration model

Cheng, F. T., Chen, Y. L. & Chang, J. Y. C., 2012 八月 13, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 3, p. 394-407 14 p., 6117097.

研究成果: Article

integrated circuits
engineering
Semiconductor materials
management systems
cycles
2011
30 引文 (Scopus)

Automatic data quality evaluation for the AVM system

Huang, Y. T. & Cheng, F. T., 2011 八月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 24, 3, p. 445-454 10 p., 5766761.

研究成果: Article

metrology
evaluation
Thin film transistors
Liquid crystal displays
Principal component analysis
29 引文 (Scopus)

Benefit model of virtual metrology and integrating AVM into MES

Cheng, F-T., Chang, J. Y. C., Huang, H. C., Kao, C. A., Chen, Y. L. & Peng, J. L., 2011 五月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 24, 2, p. 261-272 12 p., 5682063.

研究成果: Article

metrology
manufacturing
Semiconductor materials
inspection
Inspection
15 引文 (Scopus)

Selection schemes of dual virtual-metrology outputs for enhancing prediction accuracy

Wu, W. M., Cheng, F-T., Lin, T. H., Zeng, D. L. & Chen, J. F., 2011 四月 1, 於 : IEEE Transactions on Automation Science and Engineering. 8, 2, p. 311-318 8 p., 5634122.

研究成果: Article

Neural networks
Liquid crystal displays
Backpropagation
Industrial plants
Chemical vapor deposition
2010
12 引文 (Scopus)

Advanced E-manufacturing model: The significance of large-scale, distributed, and object-oriented systems

Cheng, F-T., Tsai, W. H., Wang, T. L., Yung-Cheng Chang, J. & Su, Y. C., 2010 三月 1, 於 : IEEE Robotics and Automation Magazine. 17, 1, p. 71-84 14 p., 5430394.

研究成果: Article

Productivity
Production platforms
Decision making
Semiconductor materials
Industry
4 引文 (Scopus)

An efficient data exchange scheme for semiconductor engineering chain management system

Hunga, M. H., Wu, S. W., Wang, T. L., Cheng, F-T. & Feng, Y. Y., 2010 一月 1, 於 : Robotics and Computer-Integrated Manufacturing. 26, 5, p. 507-516 10 p.

研究成果: Article

Data Exchange
Electronic data interchange
Semiconductors
Semiconductor materials
Engineering
2009
2 引文 (Scopus)
Electronic data interchange
Service oriented architecture (SOA)
Interoperability
Data integration
Web services
34 引文 (Scopus)

NN-based key-variable selection method for enhancing virtual metrology accuracy

Lin, T. H., Cheng, F-T., Wu, W. M., Kao, C. A., Ye, A. J. & Chang, F. C., 2009 二月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 22, 1, p. 204-211 8 p., 4773490.

研究成果: Article

metrology
Neural networks
regression analysis
Recurrent neural networks
Backpropagation
2008
42 引文 (Scopus)

Accuracy and real-time considerations for implementing various virtual metrology algorithms

Su, Y. C., Lin, T. H., Cheng, F-T. & Wu, W. M., 2008 八月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 21, 3, p. 426-434 9 p., 4589025.

研究成果: Article

metrology
Process control
wafers
requirements
Recurrent neural networks
1 引文 (Scopus)
Recovery
Distributed computer systems
Computer system recovery
Software architecture
Availability
14 引文 (Scopus)

Development of an Interface C framework for semiconductor e-Diagnostics systems

Hung, M. H., Wang, T. L., Hsu, F. Y. & Cheng, F-T., 2008 六月 1, 於 : Robotics and Computer-Integrated Manufacturing. 24, 3, p. 370-383 14 p.

研究成果: Article

Semiconductors
Diagnostics
Semiconductor materials
Interoperability
XML
55 引文 (Scopus)

Evaluating reliance level of a virtual metrology system

Cheng, F-T., Chen, Y. T., Su, Y. C. & Zeng, D. L., 2008 二月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 21, 1, p. 92-102 11 p.

研究成果: Article

metrology
Semiconductor materials
Gaging
Foundries
Liquid crystal displays
2007
73 引文 (Scopus)

A novel virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing

Hung, M. H., Lin, T. H., Cheng, F-T. & Lin, R. C., 2007 六月 1, 於 : IEEE/ASME Transactions on Mechatronics. 12, 3, p. 308-316 9 p.

研究成果: Article

Chemical vapor deposition
Semiconductor materials
Neural networks
Backpropagation
Defects
Software engineering
Testing
Software testing
Planning
Costs
60 引文 (Scopus)

Dual-phase virtual metrology scheme

Cheng, F-T., Huang, H. C. & Kao, C. A., 2007 十一月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 20, 4, p. 566-571 6 p., 4369327.

研究成果: Article

metrology
wafers
Thin film transistors
Liquid crystal displays
Glass