• 2212 引文
  • 27 h-指數
1983 …2019
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研究成果 1983 2019

篩選
Article
2019

A Gradual Refreshing Scheme for Improving Tool Utilization

Yang, H. C., Tsai, T. H., Tieng, H. & Cheng, F. T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 515-522 8 p., 8605344.

研究成果: Article

Machining
Availability
Modeling
Model
Coating

An Intelligent Metrology Architecture with AVM for Metal Additive Manufacturing

Yang, H. C., Adnan, M., Huang, C. H., Cheng, F-T., Lo, Y-L. & Hsu, C. H., 2019 七月 1, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2886-2893 8 p., 8733865.

研究成果: Article

3D printers
Metrology
Manufacturing
Metals
Module

A Novel Efficient Big Data Processing Scheme for Feature Extraction in Electrical Discharge Machining

Chen, C. C., Hung, M. H., Suryajaya, B., Lin, Y. C., Yang, H. C., Huang, H. C. & Cheng, F. T., 2019 四月 1, 於 : IEEE Robotics and Automation Letters. 4, 2, p. 910-917 8 p., 8605347.

研究成果: Article

Electric discharge machining
Machining
Feature Extraction
Feature extraction
Electric sparks

Automatic Virtual Metrology for Carbon Fiber Manufacturing

Hsieh, Y. M., Lin, C. Y., Yang, Y. R., Hung, M. H. & Cheng, F. T., 2019 七月, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2730-2737 8 p., 8716511.

研究成果: Article

Carbon Fiber
Metrology
Carbon fibers
Manufacturing
Inspection

Time Series Prediction Algorithm for Intelligent Predictive Maintenance

Lin, C. Y., Hsieh, Y. M., Cheng, F. T., Huang, H. C. & Adnan, M., 2019 七月, 於 : IEEE Robotics and Automation Letters. 4, 3, p. 2807-2814 8 p., 8721101.

研究成果: Article

Time Series Prediction
Time series
Maintenance
Target
Exponential Model
2018
1 引文 (Scopus)

A Novel Automated Construction Scheme for Efficiently Developing Cloud Manufacturing Services

Chen, C. C., Hung, M. H., Li, P. Y., Lin, Y. C., Liu, Y. Y. & Cheng, F. T., 2018 七月 1, 於 : IEEE Robotics and Automation Letters. 3, 3, p. 1378-1385 8 p.

研究成果: Article

Manufacturing
Manufacturing Industries
Metrology
System Architecture
Work Flow
1 引文 (Scopus)

Automatic Virtual Metrology and Deformation Fusion Scheme for Engine-Case Manufacturing

Tieng, H., Tsai, T. H., Chen, C. F., Yang, H. C., Huang, J. W. & Cheng, F. T., 2018 四月 1, 於 : IEEE Robotics and Automation Letters. 3, 2, p. 934-941 8 p., 8255616.

研究成果: Article

Metrology
Fusion
Engine
Fusion reactions
Manufacturing

Interaction-Effect Search Algorithm for the KSA Scheme

Lin, C. Y., Hsieh, Y. M., Cheng, F. T., Yang, Y. R. & Adnan, M., 2018 十月, 於 : IEEE Robotics and Automation Letters. 3, 4, p. 2778-2785 8 p.

研究成果: Article

Interaction Effects
Search Algorithm
Roots
Industry
Profitability
2017
2 引文 (Scopus)
Wear of materials
Neural networks
Industrial plants
Logistics
Machining
5 引文 (Scopus)

A scheme of high-dimensional key-variable search algorithms for yield improvement

Cheng, F. T., Hsieh, Y. S., Zheng, J. W., Chen, S. M., Xiao, R. X. & Lin, C. Y., 2017 一月 1, 於 : IEEE Robotics and Automation Letters. 2, 1, p. 179-186 8 p., 7498656.

研究成果: Article

Search Algorithm
High-dimensional
Roots
Thin-film Transistor
Liquid Crystal Display
5 引文 (Scopus)

Automatic Virtual Metrology and Target Value Adjustment for Mass Customization

Tieng, H., Chen, C. F., Cheng, F. T. & Yang, H. C., 2017 四月 1, 於 : IEEE Robotics and Automation Letters. 2, 2, p. 546-553 8 p., 7801027.

研究成果: Article

Mass Customization
Metrology
Wheels
Adjustment
Wheel
1 引文 (Scopus)

Blind-Stage Search Algorithm for the Key-Variable Search Scheme

Cheng, F. T., Lin, C. Y., Chen, C. F., Xiao, R. X., Zheng, J. W. & Hsieh, Y. S., 2017 十月 1, 於 : IEEE Robotics and Automation Letters. 2, 4, p. 1840-1847 8 p., 7934071.

研究成果: Article

Search Algorithm
Roots
Enhancement
Profitability
Defect density
27 引文 (Scopus)
Thing
Manufacturing
Internet of Things
Semiconductor Manufacturing
Manufacturing Industries
5 引文 (Scopus)
Multi-model
Metrology
Industrial plants
Model
Cloud computing
2016
9 引文 (Scopus)
Machining
Machine tools
Industry
Ontology
Cutting tools
1 引文 (Scopus)

Automated sampling decision scheme for the AVM system

Cheng, F. T., Hsieh, Y. S., Chen, C. F. & Lyu, J. R., 2016 十一月 1, 於 : International Journal of Production Research. 54, 21, p. 6351-6366 16 p.

研究成果: Article

Sampling
Industrial plants
4 引文 (Scopus)

Automatic virtual metrology for wheel machining automation

Yang, H. C., Tieng, H. & Cheng, F. T., 2016 十一月 1, 於 : International Journal of Production Research. 54, 21, p. 6367-6377 11 p.

研究成果: Article

Wheels
Machining
Automation
Inspection
Machine tools
18 引文 (Scopus)

Industry 4.1 for Wheel Machining Automation

Cheng, F. T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Machining
Wheel
Automation
Wheels
Industry

Industry 4.1 for Wheel Machining Automation

Cheng, F-T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Machining
Wheel
Automation
Wheels
Industry

Industry 4.1 for Wheel Machining Automation

Cheng, F. T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 一月 1, 於 : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

研究成果: Article

Wheels
Machining
Automation
Industry
Defects
9 引文 (Scopus)
Machine tools
Inspection
Machining
Feature extraction
Cleaning
2015

CASE 2014 [Society News]

Luo, R. C. & Cheng, F. T., 2015 一月 1, 於 : IEEE Robotics and Automation Magazine. 22, 1, p. 130-131 2 p., 7059272.

研究成果: Article

Automation
Robotics
Industry
11 引文 (Scopus)
Metrology
Semiconductors
Industry
Semiconductor materials
Servers
5 引文 (Scopus)

Intelligent sampling decision scheme based on the AVM system

Cheng, F. T., Chen, C. F., Hsieh, Y. S., Huang, H. H. & Wu, C. C., 2015 四月 3, 於 : International Journal of Production Research. 53, 7, p. 2073-2088 16 p.

研究成果: Article

Sampling
Inspection
Monitoring
Costs
16 引文 (Scopus)

Tutorial on applying the VM technology for TFT-LCD manufacturing

Cheng, F-T., Kao, C. A., Chen, C. F. & Tsai, W. H., 2015 二月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 28, 1, p. 55-69 15 p., 6983605.

研究成果: Article

Thin film transistors
Liquid crystal displays
metrology
transistors
manufacturing
2014
6 引文 (Scopus)
Liquid crystal displays
Industrial plants
Color
2013
7 引文 (Scopus)
Plasma enhanced chemical vapor deposition
Solar cells
Inspection
Sampling
Feedback
19 引文 (Scopus)

Run-to-run control utilizing virtual metrology with reliance index

Kao, C. A., Cheng, F. T., Wu, W. M., Kong, F. W. & Huang, H. H., 2013 二月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 69-81 13 p., 6357325.

研究成果: Article

metrology
Feedback
Gages
maintenance
Process control
12 引文 (Scopus)

VM-based baseline predictive maintenance scheme

Hsieh, Y. S., Cheng, F. T., Huang, H. C., Wang, C. R., Wang, S. C. & Yang, H. C., 2013 二月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 132-144 13 p., 6304937.

研究成果: Article

maintenance
Failure analysis
prognosis
Degradation
metrology
2012
9 引文 (Scopus)

A novel automatic virtual metrology system architecture for TFT-LCD industry based on main memory database

Hung, M. H., Tsai, W. H., Yang, H. C., Kao, Y. J. & Cheng, F-T., 2012 八月 1, 於 : Robotics and Computer-Integrated Manufacturing. 28, 4, p. 559-568 10 p.

研究成果: Article

Metrology
System Architecture
Liquid crystal displays
Industry
Data storage equipment
1 引文 (Scopus)
Production control
Electronic data interchange
Liquid crystal displays
Control systems
Planning
54 引文 (Scopus)

Developing an automatic virtual metrology system

Cheng, F. T., Huang, H. C. & Kao, C. A., 2012 一月 1, 於 : IEEE Transactions on Automation Science and Engineering. 9, 1, p. 181-188 8 p., 6051498.

研究成果: Article

Industrial plants
Semiconductor materials
Thin film transistors
Liquid crystal displays
Optoelectronic devices
9 引文 (Scopus)

Development of an AVM System Implementation Framework

Hung, M. H., Chen, C. F., Huang, H. C., Yang, H. C. & Cheng, F. T., 2012 一月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 4, p. 598-613 16 p.

研究成果: Article

metrology
industrial plants
Industrial plants
Thin film transistors
Liquid crystal displays
13 引文 (Scopus)

Dynamic-moving-window scheme for virtual-metrology model refreshing

Wu, W. M., Cheng, F-T. & Kong, F. W., 2012 五月 11, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 2, p. 238-246 9 p., 6126059.

研究成果: Article

metrology
experiment design
predictions
Design of experiments
resources
4 引文 (Scopus)

Engineering chain: A novel semiconductor engineering collaboration model

Cheng, F. T., Chen, Y. L. & Chang, J. Y. C., 2012 八月 13, 於 : IEEE Transactions on Semiconductor Manufacturing. 25, 3, p. 394-407 14 p., 6117097.

研究成果: Article

integrated circuits
engineering
Semiconductor materials
management systems
cycles
2011
30 引文 (Scopus)

Automatic data quality evaluation for the AVM system

Huang, Y. T. & Cheng, F. T., 2011 八月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 24, 3, p. 445-454 10 p., 5766761.

研究成果: Article

metrology
evaluation
Thin film transistors
Liquid crystal displays
Principal component analysis
30 引文 (Scopus)

Benefit model of virtual metrology and integrating AVM into MES

Cheng, F. T., Chang, J. Y. C., Huang, H. C., Kao, C. A., Chen, Y. L. & Peng, J. L., 2011 五月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 24, 2, p. 261-272 12 p., 5682063.

研究成果: Article

metrology
manufacturing
Semiconductor materials
inspection
Inspection
15 引文 (Scopus)

Selection schemes of dual virtual-metrology outputs for enhancing prediction accuracy

Wu, W. M., Cheng, F. T., Lin, T. H., Zeng, D. L. & Chen, J. F., 2011 四月 1, 於 : IEEE Transactions on Automation Science and Engineering. 8, 2, p. 311-318 8 p., 5634122.

研究成果: Article

Neural networks
Liquid crystal displays
Backpropagation
Industrial plants
Chemical vapor deposition
2010
12 引文 (Scopus)

Advanced E-manufacturing model: The significance of large-scale, distributed, and object-oriented systems

Cheng, F-T., Tsai, W. H., Wang, T. L., Yung-Cheng Chang, J. & Su, Y. C., 2010 三月 1, 於 : IEEE Robotics and Automation Magazine. 17, 1, p. 71-84 14 p., 5430394.

研究成果: Article

Productivity
Production platforms
Decision making
Semiconductor materials
Industry
4 引文 (Scopus)

An efficient data exchange scheme for semiconductor engineering chain management system

Hunga, M. H., Wu, S. W., Wang, T. L., Cheng, F-T. & Feng, Y. Y., 2010 一月 1, 於 : Robotics and Computer-Integrated Manufacturing. 26, 5, p. 507-516 10 p.

研究成果: Article

Data Exchange
Electronic data interchange
Semiconductors
Semiconductor materials
Engineering
2009
2 引文 (Scopus)
Electronic data interchange
Service oriented architecture (SOA)
Interoperability
Data integration
Web services
34 引文 (Scopus)

NN-based key-variable selection method for enhancing virtual metrology accuracy

Lin, T. H., Cheng, F-T., Wu, W. M., Kao, C. A., Ye, A. J. & Chang, F. C., 2009 二月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 22, 1, p. 204-211 8 p., 4773490.

研究成果: Article

metrology
Neural networks
regression analysis
Recurrent neural networks
Backpropagation
2008
42 引文 (Scopus)

Accuracy and real-time considerations for implementing various virtual metrology algorithms

Su, Y. C., Lin, T. H., Cheng, F. T. & Wu, W. M., 2008 八月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 21, 3, p. 426-434 9 p., 4589025.

研究成果: Article

metrology
Process control
wafers
requirements
Recurrent neural networks
1 引文 (Scopus)
Recovery
Distributed computer systems
Computer system recovery
Software architecture
Availability
14 引文 (Scopus)

Development of an Interface C framework for semiconductor e-Diagnostics systems

Hung, M. H., Wang, T. L., Hsu, F. Y. & Cheng, F-T., 2008 六月 1, 於 : Robotics and Computer-Integrated Manufacturing. 24, 3, p. 370-383 14 p.

研究成果: Article

Semiconductors
Diagnostics
Semiconductor materials
Interoperability
XML
55 引文 (Scopus)

Evaluating reliance level of a virtual metrology system

Cheng, F. T., Chen, Y. T., Su, Y. C. & Zeng, D. L., 2008 二月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 21, 1, p. 92-102 11 p.

研究成果: Article

metrology
Semiconductor materials
Gaging
Foundries
Liquid crystal displays
2007
75 引文 (Scopus)

A novel virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing

Hung, M. H., Lin, T. H., Cheng, F-T. & Lin, R. C., 2007 六月 1, 於 : IEEE/ASME Transactions on Mechatronics. 12, 3, p. 308-316 9 p.

研究成果: Article

Chemical vapor deposition
Semiconductor materials
Neural networks
Backpropagation
Defects
Software engineering
Testing
Software testing
Planning
Costs
60 引文 (Scopus)

Dual-phase virtual metrology scheme

Cheng, F. T., Huang, H. C. & Kao, C. A., 2007 十一月 1, 於 : IEEE Transactions on Semiconductor Manufacturing. 20, 4, p. 566-571 6 p., 4369327.

研究成果: Article

metrology
wafers
Thin film transistors
Liquid crystal displays
Glass