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查看斯高帕斯 (Scopus) 概要
李 宜真
副教授
統計學系
電話
886 6 2757575 ext 53642
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iclee
mail.ncku.edu
tw
h-index
156
引文
8
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
2016
2023
每年研究成果
概覽
指紋
網路
專案
(6)
研究成果
(12)
類似的個人檔案
(1)
監製作品
(5)
指紋
查看啟用 I-Chen Lee 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Engineering
Accelerated Life Test
100%
Test Plan
94%
Mechanical Fatigue Test
66%
Optimal Design
66%
Stress Level
61%
Optimum Design
55%
Degradation Model
50%
Degradation Process
33%
User Interface
33%
Reliability Engineering
33%
Test Analysis
33%
Health System
33%
Sensor Signal
33%
Parameter Estimation
33%
NASA
33%
Degradation Product
33%
Reliability Data
33%
Active Research
33%
Error Rate
33%
Sensor Data
33%
Analytical Approach
33%
Design Problem
33%
Reliability Analysis
33%
Jet Engine
33%
Reliability Assessment
33%
Nonlinear Model
33%
Test Unit
25%
Supplementary Material
19%
Past Year
16%
Accurate Prediction
16%
Static Input
16%
Real Application
16%
Fatigue Testing
16%
Reliability Prediction
16%
Recurrent
16%
Parameter Estimate
16%
Wireless Technology
16%
Mobile Phone
16%
Lifecycle
16%
Blood Glucose
16%
Illustrates
16%
Potential Customer
16%
Grid Search
11%
Composite Material
11%
Testing Time
11%
Search Algorithm
11%
Estimation Procedure
11%
Field Performance
11%
Collect Data
11%
Measurement Frequency
11%
Keyphrases
Sequential Bayesian
50%
Bayesian Design
50%
Statistical Analysis
44%
Facebook
33%
EWMA Controller
33%
Sequential Optimal Design
33%
Multivariate EWMA
33%
Reliability Data
33%
Reliability Analysis
33%
Physical Education
33%
Numeric Keypad
33%
Product Analysis
33%
Optimum Allocation
33%
Exponential Dispersion Models
33%
Degradation of Buildings
33%
Product Degradation
33%
Composite Fatigue
33%
Global Planning
33%
Batch Sequential Design
33%
Badminton
33%
Test Planning
27%
Skill Learning
22%
Footwork
22%
Polymer Composites
16%
Product Use
16%
Covariate Information
16%
Fatigue Testing
16%
Rapid Development
16%
First Review
16%
Test Allocation
16%
Sensor Technology
16%
Reliability Prediction
16%
Degradation Data
16%
By-product Utilization
16%
Wireless Technology
16%
Recurrent Event Data
16%
Time-to-event Data
16%
Statistical Methods
16%
General Equivalence Theorem
13%
Degradation Modeling
13%
Paired T-test
11%
Bayesian Strategy
11%
Final Testing
11%
Optimum Plan
11%
Traditional Teaching Method
11%
E-portfolio
11%
Optimum Strategy
11%
Analysis of Covariance
11%
Total Mean Square Error
9%
Non-optimum
8%
Mathematics
Optimal Design
33%
Life Test
33%
Ordinary Differential Equation
33%
Reliability Assessment
33%
Grid Search
33%
Optimum Allocation
33%
Exponential Dispersion Model
33%
Parametric
16%
Optimum Strategy
16%
Experimenter
16%
Asymptotic Variance
11%
Sequential Test
11%
Test Unit
11%
Life Cycle
5%
Differential Equation
5%
Lognormal Distribution
5%
Deep Neural Network
5%
Minimizes
5%
Estimated Parameter
5%
Log Likelihood
5%
