每年研究成果
每年研究成果
- 6結果
搜尋結果
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2003
Enhanced hot-carrier induced degradation in pMOSFETs stressed under high gate voltage
Chen, J.-F., Tsao, C. P. & Ong, T. C., 2003 9月 1, 於: Biennial University/Government/Industry Microelectronics Symposium - Proceedings. p. 230-233 4 p.研究成果: Conference article › 同行評審
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1998
Design in hot-carrier reliability for high performance logic applications
Fang, P., Tao, J., Chen, J. F. & Hu, C., 1998, 於: Proceedings of the Custom Integrated Circuits Conference. p. 525-531 7 p.研究成果: Conference article › 同行評審
38 引文 斯高帕斯（Scopus） -
Performance and reliability of asymmetric LDD devices and logic gates
Chen, J. F., Tao, J., Fang, P. & Hu, C., 1998, 於: Proceedings of the Custom Integrated Circuits Conference. p. 533-536 4 p.研究成果: Conference article › 同行評審
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PVD TiN metal gate MOSFETs on bulk silicon and fully depleted silicon-on-insulator (FDSOI) substrates for deep sub-quarter micron CMOS technology
Maiti, B., Tobin, P. J., Hobbs, C., Hegde, R. I., Huang, F., O'Meara, D. L., Jovanovic, D., Mendicino, M., Chen, J., Connelly, D., Adetutu, O., Mogab, J., Candelaria, J. & La, L. B., 1998, 於: Technical Digest - International Electron Devices Meeting. p. 781-784 4 p.研究成果: Conference article › 同行評審
40 引文 斯高帕斯（Scopus） -
1996
Electromigration design rules for bidirectional current
Tao, J., Chen, J. F., Cheung, N. W. & Hu, C., 1996, 於: Annual Proceedings - Reliability Physics (Symposium). p. 180-187 8 p.研究成果: Conference article › 同行評審
13 引文 斯高帕斯（Scopus） -
1995
Statistical variation of NMOSFET hot-carrier lifetime and its impact on digital circuit reliability
Chen, J. F., McGaughy, B. W. & Hu, C., 1995, 於: Technical Digest - International Electron Devices Meeting. p. 29-32 4 p.研究成果: Conference article › 同行評審
3 引文 斯高帕斯（Scopus）