李 昆忠

研究成果

每年研究成果 1990 1995 1998 1999 2000 2001 2002 2004 2005 2006 2007 2008 2009 2011 2012 2014 2015 2016 2017 2018 2019 2022 2025

• 87 Conference contribution
• 62 Article
• 20 Conference article
• 6 Editorial
• 13 更多
  • 6 Patent
  • 5 Paper
  • 2 Chapter

每年研究成果

每年研究成果

搜尋結果

• 2006

  Boundary Scan and Core-Based Testing

  Lee, K. J., 2006 1月 1, VLSI Test Principles and Architectures: Design for Testability. Elsevier, p. 557-618 62 p.

  研究成果: Chapter

  • Testing 100%
  • Built-in self test 24%
  • Controller 22%
  • IEEE Standards 21%
  • Controllers 10%
  2 引文 斯高帕斯（Scopus）

• Test Compression

  Li, X., Lee, K. J. & Touba, N. A., 2006 1月 1, VLSI Test Principles and Architectures: Design for Testability. Elsevier, p. 341-396 56 p.

  研究成果: Chapter

  • Automatic test pattern generation 100%
  • Compression 75%
  • Data compression 71%
  • Broadcasting 66%
  • Telecommunication links 60%
  4 引文 斯高帕斯（Scopus）