搜尋結果
-
2006
Lee, K. J.,
2006 1月 1,
VLSI Test Principles and Architectures: Design for Testability. Elsevier,
p. 557-618 62 p.研究成果: Chapter
-
-
-
-
-
-
Li, X.,
Lee, K. J. &
Touba, N. A.,
2006 1月 1,
VLSI Test Principles and Architectures: Design for Testability. Elsevier,
p. 341-396 56 p.研究成果: Chapter
-
-
-
-
-