李 昆忠

研究成果

每年研究成果 1990 1995 1998 1999 2000 2001 2002 2004 2005 2006 2007 2008 2009 2011 2012 2014 2015 2016 2017 2018 2019 2022 2023

• 85 Conference contribution
• 61 Article
• 20 Conference article
• 6 Editorial
• 13 更多
  • 6 Patent
  • 5 Paper
  • 2 Chapter

每年研究成果

每年研究成果

搜尋結果

• 2017

  Foreword

  Wu, C. W., Lee, K. J., Wang, L. C. & Huang, S. Y., 2017 11月 3, 於: ITC-Asia 2017 - International Test Conference in Asia. p. iv 8097094.

  研究成果: Editorial › 同行評審
• 2010

  Welcome message from general co-chairs

  Lee, K. J. & Cheng, T., 2010, 於: Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 5496641.

  研究成果: Editorial › 同行評審
• 2009

  2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09: Foreword

  Lee, K. J. & Cheng, T., 2009 12月 1, 於: 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09. 5158077.

  研究成果: Editorial › 同行評審
• 2008

  Preface: Special issue on VLSI design/CAD symposium

  Lee, K-J. & Wang, C. C., 2008 4月 1, 於: International Journal of Electrical Engineering. 15, 2

  研究成果: Editorial › 同行評審
• 2006

  Special issue preface

  Lee, K. J. & Liu, B. D., 2006 2月, 於: International Journal of Electrical Engineering. 13, 1, p. i

  研究成果: Editorial › 同行評審
• 2002

  Guest editorial

  Lee, K. J. & Su, C. C., 2002 2月, 於: Journal of Electronic Testing: Theory and Applications (JETTA). 18, 1, p. 15-16 2 p.

  研究成果: Editorial › 同行評審