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查看斯高帕斯 (Scopus) 概要
張 守進
教授
微電子工程研究所
電話
886 6 2757575 ext 62391
電子郵件
changsj
mail.ncku.edu
tw
網站
http://www.ee.ncku.edu.tw/subpage_div/teacher_new_2/index2.php?teacher_id=12
h-index
21083
引文
64
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1988 …
2024
每年研究成果
概覽
指紋
網路
專案
(73)
研究成果
(1127)
類似的個人檔案
(12)
監製作品
(73)
指紋
查看啟用 Shoou-Jinn Chang 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Engineering & Materials Science
Photodetectors
100%
Light emitting diodes
86%
Nanowires
55%
Metals
45%
Substrates
45%
Nitrides
44%
Semiconductor materials
38%
Dark currents
31%
Nanorods
26%
Photoluminescence
26%
Temperature
26%
Annealing
26%
Thin films
25%
Sapphire
24%
Zinc oxide
24%
Epitaxial films
23%
Heterojunctions
23%
Tin oxides
23%
Chemical vapor deposition
21%
Semiconductor quantum wells
21%
Leakage currents
21%
Thin film transistors
17%
Zinc Selenide
17%
Electric potential
16%
Photodiodes
16%
Oxides
16%
Oxide films
16%
Metallorganic chemical vapor deposition
15%
Electrons
15%
Optical properties
15%
Electric properties
15%
Phosphors
14%
Molecular beam epitaxy
14%
Etching
14%
Glass
14%
Wavelength
14%
Field emission
14%
High electron mobility transistors
14%
Doping (additives)
13%
Sputtering
13%
Electrodes
13%
Photocurrents
13%
MOSFET devices
12%
Quantum efficiency
11%
Oxide semiconductors
11%
Chemical sensors
11%
Buffer layers
11%
Physics & Astronomy
light emitting diodes
54%
photometers
50%
nitrides
24%
metals
19%
field effect transistors
18%
nanowires
18%
metal oxide semiconductors
15%
caps
15%
dark current
14%
metalorganic chemical vapor deposition
14%
annealing
13%
tin oxides
13%
indium oxides
13%
thin films
12%
sapphire
12%
rejection
11%
leakage
11%
vapor deposition
11%
zinc oxides
11%
fabrication
10%
photoluminescence
10%
electric potential
10%
sensors
10%
nanorods
10%
quantum wells
9%
electrodes
9%
photodiodes
9%
output
9%
etching
9%
indium
9%
templates
8%
buffers
8%
performance
8%
transistors
7%
oxides
7%
MIS (semiconductors)
7%
electric contacts
7%
electrical properties
6%
phosphors
6%
optical properties
6%
bandpass filters
6%
defects
6%
glass
6%
photocurrents
6%
temperature
5%
injection
5%
oxygen
5%
crystals
5%
characterization
5%
chips
5%
Chemical Compounds
Nanowire
29%
Leakage Current
25%
Voltage
25%
Epitaxial Film
22%
Liquid Film
18%
Field Effect
17%
Etching
15%
Annealing
15%
Schottky Barrier
14%
Photoluminescence
11%
Nanorod
10%
Wavelength
10%
Glass Substrate
10%
Electrostatic Discharge
10%
Molecular Beam Epitaxy
9%
Electrical Property
9%
Optical Property
9%
Zinc Oxide
9%
Oxide
9%
Surface
8%
Transconductance
8%
Dielectric Material
8%
Behavior as Electrode
8%
Photocurrent
8%
Field Emission
8%
Length
7%
Gas Sensor
7%
Superlattice
7%
Compound Mobility
7%
Electron Particle
7%
Sputtering
7%
Ambient Reaction Temperature
7%
Semiconductor
7%
Breakdown Voltage
7%
Chemical Vapour Deposition
6%
Tunneling
6%
Blue
6%
Solar Cell
6%
Buffer Solution
6%
Resistance
6%
Time
5%
Dioxygen
5%
Transmittance
5%
Magnetron Sputtering
5%
Photoconductivity
5%
Nanoparticle
5%
Contact Resistance
5%
