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查看斯高帕斯 (Scopus) 概要
陳 元方
教授
機械工程學系
電話
886 6 2757575 ext 62162
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ctyf
mail.ncku.edu
tw
h-index
611
引文
14
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1989 …
2024
每年研究成果
概覽
指紋
網路
專案
(34)
研究成果
(91)
類似的個人檔案
(6)
監製作品
(12)
指紋
查看啟用 Terry Yuan-Fang Chen 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Engineering & Materials Science
Photoelasticity
100%
Dental composites
69%
Thin films
68%
Interferometry
67%
Correlation methods
60%
Restoration
52%
Stress measurement
49%
Composite materials
49%
Polariscopes
47%
Wavelength
43%
Polymerization
36%
Holographic interferometry
36%
Residual stresses
36%
Focused ion beams
35%
Microscopes
35%
Mica
33%
Image processing
32%
Refractive index
29%
Optical tomography
27%
Photoluminescence
25%
Scanning
25%
Nanoindentation
24%
Diamonds
23%
Defects
23%
Elastic moduli
22%
Polarization
21%
Magnetron sputtering
21%
Pixels
20%
Speckle
20%
Infrared radiation
20%
Finite element method
20%
Surface measurement
19%
Coatings
19%
Scanning electron microscopy
18%
Tissue
18%
Natural frequencies
17%
CCD cameras
17%
Temperature
17%
Contact angle
17%
Film thickness
17%
Pressure sensors
16%
Strain gages
16%
Curing
16%
Patient rehabilitation
14%
Nanocrystals
14%
Nanocrystalline silicon
14%
Mechanical properties
14%
Adhesives
14%
Temperature distribution
14%
Mathematics
Phase Shifting
67%
Digital Image Correlation
67%
Interferometry
53%
Surface Profile
50%
Fringe Analysis
38%
Infrared Image
35%
Carbon Fiber
25%
Instantaneous
25%
CCD Camera
23%
Defects
23%
Composite
23%
Infrared Thermography
22%
Refractive Index
22%
Photoelasticity
20%
Temperature Field
19%
Measurement System
17%
Shearography
17%
Transmission Electron Microscopy
17%
Thermal Infrared
16%
Photoluminescence
15%
Infrared
13%
Printed Circuit Board
13%
Stitching
13%
Grid
12%
Image Processing
12%
Residual Stress
11%
Microscope
11%
Microstructure
11%
Silicon
11%
Wavelength
10%
Sensing
10%
Contact Angle
10%
Mechanical Behavior
10%
Interference
10%
Stress Analysis
10%
Emissivity
10%
Near-field
10%
Experimental Study
9%
Physics & Astronomy
isochromatics
36%
Timoshenko beams
35%
optical microscopes
33%
near fields
27%
scanning
23%
vibration damping
23%
probes
22%
residual stress
21%
interferometry
20%
stress measurement
20%
thin films
19%
diamonds
19%
stiffness
18%
mica
18%
diffraction patterns
18%
coatings
16%
photoelasticity
16%
image processing
16%
composite materials
15%
damping
14%
vibration
14%
ion beams
14%
impulses
14%
polynomials
14%
temperature distribution
14%
warpage
14%
defects
14%
magnetron sputtering
13%
depth measurement
13%
grids
13%
film thickness
13%
spectral correlation
11%
solid mechanics
11%
photoluminescence
11%
refractivity
11%
profiles
10%
finite element method
10%
scanning electron microscopy
10%
titanium nitrides
9%
boundary conditions
9%
electromigration
9%
sensitivity
9%
curve fitting
9%
screws
8%
nanocrystals
8%
carbon fibers
8%
evaluation
8%
emissivity
8%
inertia
8%
shrinkage
8%
