We use steady-state capacitance measurement originally intended for capacitance-voltage experiment to observe and characterize the electrical properties of deep defects in β-Ga2O3 semiconductors. We detect a deep level located 0.81 eV below the conduction band edge with a concentration of 1.2 ' 1016 cm%3 and a capture cross-section of 1.1 ' 10%14 cm2, making it potentially influential in determining the performance of β-Ga2O3 based power electronic and optoelectronic devices. This deep level may dominate the thermal activation of off-state drain current in β-Ga2O3 transistors at high temperatures and, together with another shallower level at 0.13 eV, may substantially lower the breakdown voltage in Schottky diodes.
All Science Journal Classification (ASJC) codes
- 工程 (全部)
- 物理與天文學 (全部)