TY - JOUR
T1 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
T2 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
AU - Lee, Kuen Jong
AU - Cheng, Tim
PY - 2009/12/1
Y1 - 2009/12/1
UR - http://www.scopus.com/inward/record.url?scp=77950642825&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77950642825&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2009.5158077
DO - 10.1109/VDAT.2009.5158077
M3 - Editorial
AN - SCOPUS:77950642825
JO - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
JF - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
M1 - 5158077
Y2 - 28 April 2009 through 30 April 2009
ER -