摘要
Switching buck converters with dynamic voltage scaling (DVS) for high-efficiency high-performance computing applications need to reduce the output-voltage undershoot/overshoot (V-{ {US}}/V-{ {OS}}) and settling time t-{ {S}} under a large and fast-changing load current (I-{ {load}}). A multiphase topology with a fast load-transient response meets these requirements. The load-transient response can be accurately accelerated to reduce V-{ {US}}/V-{ {OS}} and t-{ {S}} to near their ideal values by measuring the output-capacitor current I-{ {C} {o}} to control the inductor's energizing and de-energizing times, since I-{ {C} {o}} instantly reflects the load-current transients. An integrated capacitor-current sensor (CCS) [1] can be used to sense I-{ {C} {o}} by emulating the output-capacitor impedance Z-{ {C} {o}}: comprising capacitance C-{{O}}, the equivalent series resistance R-{ {E} {S} {R}}, and inductance L-{ {E} {S} {L}}. However, I-{ {C} {o}} will be inaccurately sensed if Z-{ {C} {o}} varies with different output voltages V-{{O}}, manufacturing variations, PCB parasitics, temperature, and aging. The state-of-the-art CCS calibration technique [1] for such Z-{ {C} {o}} variations is suitable for foreground operation and DVS with pre-characterized V-{{O}} levels, since calibration starts immediately after being enabled and runs continuously until it ends. The CCS in [1] is calibrated with a low-power cost-effective comparator and successive approximation logic, with an acceptable calibration time T-{{CAL}} for foreground operation. To broaden the range of applications, this work proposes an ADC-based CCS and a background CCS calibration (BCC) controller. The proposed CCS uses a flash ADC with a dynamic reference to shorten T-{ {C} {A} {L}}. The BCC controller automatically finds a quasi-steady state (OS), namely a short period of steady-state behavior when there is no load transient or DVS event, to trigger CCS calibration, and can interrupt CCS calibration when a load transient or a DVS event occurs. Since OSs generally exist, the BCC with a short T-{{CAL}} can increase the flexibility of scheduling both load transients and DVS events. Thus, it is suitable for DVS with numerous V-{{O}} levels that account for in situ parameter variations.
| 原文 | English |
|---|---|
| 主出版物標題 | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 |
| 發行者 | Institute of Electrical and Electronics Engineers Inc. |
| 頁面 | 430-432 |
| 頁數 | 3 |
| ISBN(電子) | 9781538685310 |
| DOIs | |
| 出版狀態 | Published - 2019 3月 6 |
| 事件 | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 - San Francisco, United States 持續時間: 2019 2月 17 → 2019 2月 21 |
出版系列
| 名字 | Digest of Technical Papers - IEEE International Solid-State Circuits Conference |
|---|---|
| 卷 | 2019-February |
| ISSN(列印) | 0193-6530 |
Conference
| Conference | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 |
|---|---|
| 國家/地區 | United States |
| 城市 | San Francisco |
| 期間 | 19-02-17 → 19-02-21 |
UN SDG
此研究成果有助於以下永續發展目標
-
SDG 9 產業、創新與基礎設施
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 電氣與電子工程
指紋
深入研究「27.6 Background Capacitor-Current-Sensor Calibration of DC-DC Buck Converter with DVS for Accurately Accelerating Load-Transient Response」主題。共同形成了獨特的指紋。引用此
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