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出版年份

  • 2020
  • 2019
  • 2018
  • 2017

作者

  • Cheng-Wen Wu
2017

A Built-Off Self-Repair Scheme for Channel-Based 3D Memories

Liu, H. H., Lin, B. Y., Wu, C. W., Chiang, W. T., Mincent, L., Lin, H. C., Peng, C. N. & Wang, M. J., 2017 八月 1, 於 : IEEE Transactions on Computers. 66, 8, p. 1293-1301 9 p., 7850958.

研究成果: Article

2 引文 斯高帕斯(Scopus)

Building a fault tolerant framework with deadline guarantee in big data stream computing environments

Sun, D., Zhang, G., Wu, C., Li, K. & Zheng, W., 2017 十一月, 於 : Journal of Computer and System Sciences. 89, p. 4-23 20 p.

研究成果: Article

12 引文 斯高帕斯(Scopus)

Cell-Aware Test Generation Time Reduction by Using Switch-Level ATPG

Wu, C-W., Chuang, P-Y. & Chen, H. H., 2017 九月, IEEE Int. Test Conf. in Asia (ITC-A). Taipei

研究成果: Conference contribution

Controller architecture for low-power, low-latency DRAM with built-in cache

Liu, Z. Y., Shih, H. C., Lin, B. Y. & Wu, C. W., 2017 四月 1, 於 : IEEE Design and Test. 34, 2, p. 69-78 10 p., 7397924.

研究成果: Article

1 引文 斯高帕斯(Scopus)

Fault Models and Test Algorithms for Multi-Level Cell (MLC) Crossbar RRAM

Wu, C-W. & Hou, K-W., 2017 七月, VLSI Test Technology Workshop (VTTW). Nantou

研究成果: Conference contribution

Foreword

Wu, C. W., Lee, K. J., Wang, L. C. & Huang, S. Y., 2017 十一月 3, 於 : ITC-Asia 2017 - International Test Conference in Asia. p. iv 8097094.

研究成果: Editorial

Highly Reliable and Low-Cost Symbiotic IOT Devices and Systems

Wu, C-W., Lin, B-Y., Hung, H-W., Tseng, S-M. & Chen, C., 2017 十月, IEEE Int. Test Conf. (ITC). Fort Worth, Texas

研究成果: Conference contribution

3 引文 斯高帕斯(Scopus)

Large graph computing systems

Wu, C., Zhang, G., Li, K. & Zheng, W., 2017 一月 1, Big Data Management and Processing. CRC Press, p. 347-362 16 p.

研究成果: Chapter

Symbiotic system models for efficient IGT system design and test

Wu, C. W., Lin, B. Y., Hung, H. W., Tseng, S. M. & Chen, C., 2017 十一月 3, ITC-Asia 2017 - International Test Conference in Asia. Institute of Electrical and Electronics Engineers Inc., p. 71-76 6 p. 8097114. (ITC-Asia 2017 - International Test Conference in Asia).

研究成果: Conference contribution

4 引文 斯高帕斯(Scopus)

Symbiotic System Models for Efficient IOT System Design and Test

Wu, C-W., Chen, C., Lin, B-Y., Hung, H-W. & Tseng, S-M., 2017 九月, IEEE Int. Test Conf. in Asia (ITC-A). Taipei

研究成果: Conference contribution

Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package

Wang, K. L., Lin, B. Y., Wu, C. W., Lee, M., Chen, H., Lin, H. C., Peng, C. N. & Wang, M. J., 2017 六月 1, 於 : IEEE Design and Test. 34, 3, p. 50-58 9 p., 7464303.

研究成果: Article

3 引文 斯高帕斯(Scopus)
2018

A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit

Chen, M. C., Wu, T. H. & Wu, C. W., 2018 十二月 6, Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018. IEEE Computer Society, p. 19-24 6 p. 8567404. (Proceedings of the Asian Test Symposium; 卷 2018-October).

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices

Pan, Y-C., Jian, Y-R., Liu, H-H. & Wu, C-W., 2018 七月, VLSI Test Technology Workshop (VTTW). Nantou

研究成果: Conference contribution

An enhanced boundary scan architecture for inter-die interconnect leakage measurement in 2.5D and 3D packages

Law, P. M. P., Wu, C. W., Lin, L. Y. & Hong, H. C., 2018 一月 24, Proceedings - 2017 IEEE 26th Asian Test Symposium, ATS 2017. Taipei: IEEE Computer Society, p. 1-6 6 p. (Proceedings of the Asian Test Symposium).

研究成果: Conference contribution

Automated Probe-Mark Analysis

Wu, C-W., Jian, Y-R., Fodor, F. & Marinissen, E. J., 2018 六月, Semiconductor Wafer Test Workshop (SWTW).

研究成果: Conference contribution

Covering hard-To-detect defects by thermal quorum sensing

Chuang, P. Y., Wu, C. W. & Chen, H. H., 2018 六月 29, Proceedings - 2018 23rd IEEE European Test Symposium, ETS 2018. Bremen: Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (Proceedings of the European Test Workshop; 卷 2018-May).

研究成果: Conference contribution

RRAM-based neuromorphic hardware reliability improvement by self-healing and error correction

Hu, J. Y., Hou, K. W., Lo, C. Y., Chou, Y. F. & Wu, C. W., 2018 九月 11, Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018. Institute of Electrical and Electronics Engineers Inc., p. 19-24 6 p. 8462942. (Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018).

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

Symbiotic Controller Design Using a Memory-Based FSM Model

Kuo, S. F. & Wu, C. W., 2018 八月 10, Proceedings - 2018 IEEE 27th International Symposium on Industrial Electronics, ISIE 2018. Institute of Electrical and Electronics Engineers Inc., p. 874-879 6 p. 8433783. (IEEE International Symposium on Industrial Electronics; 卷 2018-June).

研究成果: Conference contribution

2019

A Self-Organizing Map-Based Adaptive Traffic Light Control System with Reinforcement Learning

Kao, Y. C. & Wu, C. W., 2019 二月 19, Conference Record of the 52nd Asilomar Conference on Signals, Systems and Computers, ACSSC 2018. Matthews, M. B. (編輯). IEEE Computer Society, p. 2060-2064 5 p. 8645125. (Conference Record - Asilomar Conference on Signals, Systems and Computers; 卷 2018-October).

研究成果: Conference contribution

Redio: Accelerating Disk-Based Graph Processing by Reducing Disk I/Os

Wu, C., Zhang, G., Wang, Y., Jiang, X. & Zheng, W., 2019 三月 1, 於 : IEEE Transactions on Computers. 68, 3, p. 414-425 12 p., 8489961.

研究成果: Article

Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits

Marinissen, E. J., Fodor, F., Podpod, A., Stucchi, M., Jian, Y. R. & Wu, C. W., 2019 一月 23, International Test Conference 2018, ITC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8624731. (Proceedings - International Test Conference; 卷 2018-October).

研究成果: Conference contribution

The last byte: Baseball and testing

Wu, C. W., 2019 十二月, 於 : IEEE Design and Test. 36, 6, 1 p., 8844727.

研究成果: Comment/debate