A 0.5 μm concurrent testable chip of a fifth-order gm-C filter

Kuen Jong Lee, Wei Chiang Wang

研究成果: Article同行評審

3 引文 斯高帕斯(Scopus)


In this paper, we describe a testable chip of a fifth-order gm-C low-pass filter that has a passband from 0 to 4.5 MHz. We use a current-mode method for the error detection of this filter. By comparing the current consumed by the circuit under test (CUT) and the current converted from the voltage levels of the CUT, abnormal function of circuit components can be concurrently and efficiently detected. A test chip has been fabricated using a 0.5 μm, 2P2M CMOS technology. Measurement results show that this current-mode approach has little impact on the performance of the filter and can detect faults in the filter effectively. The area overhead of the circuitry for testing in this chip is about 18%.

頁(從 - 到)231-247
期刊Analog Integrated Circuits and Signal Processing
出版狀態Published - 2002 9月

All Science Journal Classification (ASJC) codes

  • 訊號處理
  • 硬體和架構
  • 表面、塗料和薄膜


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