摘要
This paper presents a new circuit technique named residue oversampling, which is suitable for high-resolution analog-to-digital converters (ADCs). By adopting this technique and simplifying the dynamic element matching, the impacts of capacitor mismatch and noise upon the successive-approximation register ADCs are reduced significantly without calibrations. The proof-of-concept prototype was fabricated in TSMC 40-nm CMOS technology. At 40-MS/s and 10-MS/s sampling rates, the measured peak signal-to-noise and distortion ratios are 66.84 and 69.78 dB, respectively.
原文 | English |
---|---|
頁(從 - 到) | 881-890 |
頁數 | 10 |
期刊 | IEEE Transactions on Circuits and Systems I: Regular Papers |
卷 | 65 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 2018 三月 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering