A 3mW 2.7GS/s 8b Subranging ADC with Multiple-Reference-Reference-Embedded Comparators

Jia Ching Wang, Tai Haur Kuo

研究成果: Conference contribution

摘要

A subranging ADC is a good choice for wideband applications since the numerous comparators for a flash ADC can be avoided [1-5]. However, despite the reduced number of comparators that a subranging ADC requires, these comparators still consume a considerable amount of power and induce a severe kickback error as well as heavy parasitics, thus degrading the accuracy of the ADC. In addition, a power-hungry resistor ladder is also required to provide reference voltages for the comparators. Although the reference-embedded comparator (REC) can avoid the use of a resistor ladder by realizing a deliberate offset voltage as an embedded reference (ER) voltage inside a comparator [3], [5], the aforementioned problems attributed to a number of comparators still exist. Therefore, to retain an ADC with both good power efficiency and good accuracy, a multiple-reference-embedded comparator (MREC) is proposed in this work, which equips multiple ER voltages in a single comparator and thereby reduces the number of comparators by over 70%.

原文English
主出版物標題2023 IEEE International Solid-State Circuits Conference, ISSCC 2023
發行者Institute of Electrical and Electronics Engineers Inc.
頁面276-278
頁數3
ISBN(電子)9781665428002
DOIs
出版狀態Published - 2023
事件2023 IEEE International Solid-State Circuits Conference, ISSCC 2023 - Virtual, Online, United States
持續時間: 2023 2月 192023 2月 23

出版系列

名字Digest of Technical Papers - IEEE International Solid-State Circuits Conference
2023-February
ISSN(列印)0193-6530

Conference

Conference2023 IEEE International Solid-State Circuits Conference, ISSCC 2023
國家/地區United States
城市Virtual, Online
期間23-02-1923-02-23

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 電氣與電子工程

指紋

深入研究「A 3mW 2.7GS/s 8b Subranging ADC with Multiple-Reference-Reference-Embedded Comparators」主題。共同形成了獨特的指紋。

引用此