A bilayer Ti/Ag ohmic contact for highly doped n-type GaN films

J. D. Guo, C. I. Lin, M. S. Feng, F. M. Pan, G. C. Chi, C. T. Lee

研究成果: Article

69 引文 斯高帕斯(Scopus)

指紋 深入研究「A bilayer Ti/Ag ohmic contact for highly doped n-type GaN films」主題。共同形成了獨特的指紋。

Physics & Astronomy