@article{0df8ea46dc864f62b5f5dce2c4810528,
title = "A built-in current sensor based on current-mode design",
abstract = "A very simple yet powerful design of a built-in current sensor for CMOS IDDQ testing is presented. Compared with previous methods, this design has lower sensitivity to parameter deviation caused by process or temperature variations. In addition, this design provides scalable sensing resolutions and programmable current reference. Experimental results show that a test response time of less than 2 ns can be acquired when the faulty IDDQ current is higher than 250 //A.",
author = "Lee, {Kuen Jong} and Tang, {Jing Jou}",
note = "Funding Information: Manuscript received January 4, 1996; revised December 19, 1996. This work was supported by the National Science Council R.O.C. under Contract NSC-83–0404–E-006–036. This paper recommended by Associate Editor G. W. Roberts. K.-J. Lee is with the Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 70101, R.O.C. J.-J. Tang is with the Department of Electronic Engineering, Nan-Tai Institute of Technology, Tainan, Taiwan 71000, R.O.C. Publisher Item Identifier S 1057-7130(98)00056-1.",
year = "1998",
doi = "10.1109/82.659464",
language = "English",
volume = "45",
pages = "133--137",
journal = "IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing",
issn = "1057-7130",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1",
}