A built-in current sensor based on current-mode design

Kuen Jong Lee, Jing Jou Tang

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)

摘要

A very simple yet powerful design of a built-in current sensor for CMOS IDDQ testing is presented. Compared with previous methods, this design has lower sensitivity to parameter deviation caused by process or temperature variations. In addition, this design provides scalable sensing resolutions and programmable current reference. Experimental results show that a test response time of less than 2 ns can be acquired when the faulty IDDQ current is higher than 250 //A.

原文English
頁(從 - 到)133-137
頁數5
期刊IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
45
發行號1
DOIs
出版狀態Published - 1998 十二月 1

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering

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