A Built-In Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM ClustersA Built-In Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters

Cheng-Wen Wu, C.-W. Wang, R.-S. Tzeng, C.-F. Wu, C.-T. Huang, S.-Y. Huang, S.-H. Lin, H.-P. Wang

研究成果: Conference contribution

原文English
主出版物標題10th IEEE Asian Test Symp. (ATS)
出版地Kyoto
出版狀態Published - 2001 十一月

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