A CMOS 1-out-of-3 totally self-checking checker

C.-Y. Lin, Y.-R. Shieh, Cheng-Wen Wu

研究成果: Conference contribution

原文English
主出版物標題International Symposium on IC Design and Manufacturing (ISIC)
出版地Singapore
頁面129-134
出版狀態Published - 1991 9月

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