A critical study on the reliability of electron temperature measurements with a langmuir probe

K. Hirao, K. Oyama

研究成果: Article同行評審

19 引文 斯高帕斯(Scopus)

摘要

Electron temperature deduced from a contaminated Langmuir probe is discussed. Laboratory and rocket experiments show that electron temperature evaluation is higher than the true value when the probe has a contaminated surface. It is concluded that the high temperature of the E-region is also due to the use of such a contaminated Langmuir probe. Hysteresis phenomenon can be explained by means of the simple equivalent circuit for the contamination layer of a probe surface.

原文English
頁(從 - 到)415-427
頁數13
期刊Journal of geomagnetism and geoelectricity
24
發行號4
DOIs
出版狀態Published - 1972

All Science Journal Classification (ASJC) codes

  • 環境科學 (全部)
  • 地球與行星科學(全部)

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