| 原文 | English |
|---|---|
| 主出版物標題 | VLSI Test Technology Workshop (VTTW) |
| 出版地 | Nantou |
| 出版狀態 | Published - 2018 7月 |
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices
Y.-C. Pan, Y.-R. Jian, H.-H. Liu, Cheng-Wen Wu
研究成果: Conference contribution