| 原文 | English |
|---|---|
| 主出版物標題 | VLSI Test Technology Workshop (VTTW) |
| 出版地 | Nantou |
| 出版狀態 | Published - 2018 7月 |
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A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices
- Y.-C. Pan
- , Y.-R. Jian
- , H.-H. Liu
- , Cheng-Wen Wu
研究成果: Conference contribution