A Discrete Degradation Model for UltraThin Gate Oxide Data

M.-H. Hsieh, Shuen-Lin Jeng

研究成果: Conference contribution

原文English
主出版物標題Joint Statistical Meetings
出版地Seattle, USA
出版狀態Published - 2006 八月 6

引用此

Hsieh, M-H., & Jeng, S-L. (2006). A Discrete Degradation Model for UltraThin Gate Oxide Data. 於 Joint Statistical Meetings