| 原文 | English |
|---|---|
| 主出版物標題 | Joint Statistical Meetings |
| 出版地 | Seattle, USA |
| 出版狀態 | Published - 2006 8月 6 |
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A Discrete Degradation Model for UltraThin Gate Oxide Data
- M.-H. Hsieh
- , Shuen-Lin Jeng
研究成果: Conference contribution