A full code-patterns coverage high-speed embedded ROM using dynamic virtual guardian technique

Meng Fan Chang, Lih Yih Chiou, Kuei Ann Wen

研究成果: Article同行評審

14 引文 斯高帕斯(Scopus)

摘要

Crosstalk between bitlines induces read failure and limits the coverage of applicable code-patterns for high-speed contact/via-programming read-only memories (ROMs) in SoC. Owing to the variation in bitline loading across code-patterns, the amount of coupled noise on an accessed bitline is code-pattern-dependent. This crosstalk effect worsens, with larger coupling capacitance and smaller intrinsic loading, as the technology node shrinks. This study proposes dynamic virtual guardian (DVG) techniques for contact/via-programming ROM macros and compilers to eliminate the crosstalk-induced read failure and increase the code-patterns coverage. Compared with conventional ROMs, DVG techniques achieve higher speed, lower power consumption and better design for manufacturing (DFM) capability with full code-patterns coverage. Experiments on fabricated designs, a conventional ROM and two 256 Kb DVG ROMs, using 0.18 μm 1P5M CMOS technology have demonstrated that DVG techniques achieve 100% code-pattern coverage under a small sensing margin.

原文English
頁(從 - 到)496-506
頁數11
期刊IEEE Journal of Solid-State Circuits
41
發行號2
DOIs
出版狀態Published - 2006 二月

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

指紋

深入研究「A full code-patterns coverage high-speed embedded ROM using dynamic virtual guardian technique」主題。共同形成了獨特的指紋。

引用此