A gate zero-bias 2W PHEMT power amplifier operating at 3.5 GHz

C. K. Chu, H. K. Huang, H. Z. Liu, C. H. Lin, M. P. Houng, Y. H. Wang, C. H. Chang, C. L. Wu, C. S. Chang

研究成果: Conference contribution

摘要

A single supply 2W MMIC power amplifier, operating between 3.3GHz and 3.8GHz by implementing AlGaAs/InGaAs/GaAs PHEMT for the applications of WiMax, is demonstrated. Using the gate zero-bias configuration, i.e., VGS=0 and IDss, one can use only one single bias instead of dual bias in the depletion mode PHEMTs. This two-stage amplifier is designed by using a zero gate bias configuration i.e., VGS=0 and at saturated drain current IDSs, for class A power amplifier operation. The two-stage MMIC amplifier possesses the characteristics of 25.9dB small-signal gain and 34.0dBm 1-dB gain compression power. Moreover, with a single carrier output power level of 21dBm, very high linearity with a 47dBm third-order intercept point operating at 3.5GHz is also achieved.

原文English
主出版物標題2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
發行者Institute of Electrical and Electronics Engineers Inc.
頁面211-214
頁數4
ISBN(列印)0780393392, 9780780393394
DOIs
出版狀態Published - 2005 一月 1
事件2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong
持續時間: 2005 十二月 192005 十二月 21

出版系列

名字2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Other

Other2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
國家Hong Kong
城市Howloon
期間05-12-1905-12-21

    指紋

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

引用此

Chu, C. K., Huang, H. K., Liu, H. Z., Lin, C. H., Houng, M. P., Wang, Y. H., Chang, C. H., Wu, C. L., & Chang, C. S. (2005). A gate zero-bias 2W PHEMT power amplifier operating at 3.5 GHz. 於 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (頁 211-214). [1635243] (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2005.1635243