TY - JOUR
T1 - A histogram-based testing method for estimating A/D converter performance
AU - Ting, Hsin Wen
AU - Liu, Bin Da
AU - Chang, Soon Jyh
N1 - Funding Information:
Manuscript received January 10, 2007; revised July 13, 2007. This work was supported in part by the National Science Council of Taiwan under Grant NSC-96-2221-E-006-294 and by the Ministry of Economic Affairs, R.O.C., under Grant 94-EC-17-A-01-S1-031.
PY - 2008/2
Y1 - 2008/2
N2 - A sine-wave histogram-testing structure for analog-to-digital converters (ADCs) is proposed. The ADC static parameters, i.e., offset error, gain error, and nonlinearity errors, are directly obtained from the sine-wave histogram test. Then, the obtained static parameters are related to the estimation of the degraded signal-to-noise ratio (SNR) value. Therefore, the relationships among these parameters are analyzed, and a single sine-wave histogram test can be performed to evaluate the ADC. With the appropriate approximations in the reference sine-wave histograms and the estimations of the ADC parameters, the realization of an ADC output analyzer circuit could be a simple task. An ADC output analyzer circuit is therefore developed and synthesized using a 0.18-μm technique to analyze the outputs of an 8-bit ADC and estimate its performances using the proposed method.
AB - A sine-wave histogram-testing structure for analog-to-digital converters (ADCs) is proposed. The ADC static parameters, i.e., offset error, gain error, and nonlinearity errors, are directly obtained from the sine-wave histogram test. Then, the obtained static parameters are related to the estimation of the degraded signal-to-noise ratio (SNR) value. Therefore, the relationships among these parameters are analyzed, and a single sine-wave histogram test can be performed to evaluate the ADC. With the appropriate approximations in the reference sine-wave histograms and the estimations of the ADC parameters, the realization of an ADC output analyzer circuit could be a simple task. An ADC output analyzer circuit is therefore developed and synthesized using a 0.18-μm technique to analyze the outputs of an 8-bit ADC and estimate its performances using the proposed method.
UR - https://www.scopus.com/pages/publications/39549103451
UR - https://www.scopus.com/pages/publications/39549103451#tab=citedBy
U2 - 10.1109/TIM.2007.910106
DO - 10.1109/TIM.2007.910106
M3 - Article
AN - SCOPUS:39549103451
SN - 0018-9456
VL - 57
SP - 420
EP - 427
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
IS - 2
ER -