A joint project to develop a VLSI testing and design for testability course for universities in Taiwan

C.-L. Lee, J.-Y. Jou, C.-S. Lin, J.-E. Chen, K.-J. Lee, C.-C. Su, Cheng-Wen Wu

研究成果: Conference contribution

原文English
主出版物標題International Conference on Engineering Education (ICEE)
出版地Chicago
頁面43-53
II
出版狀態Published - 1997 八月

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