A low minimum detectable power, high dynamic range, V-Band CMOS millimeter-wave logarithmic power detector

Chien Chang Chou, Wen Chian Lai, Tzuen Hsi Huang, Huey Ru Chuang

研究成果: Conference contribution

2 引文 斯高帕斯(Scopus)

摘要

This paper presents a V-Band logarithmic power detector fabricated in 90-nm CMOS technology. The topology of successive detection logarithmic amplifier (SDLA) is adopted for high dynamic range. Instead of using traditional differential limiting amplifiers, millimeter-wave (MMW) amplifiers are applied for the gain cells to achieve the desired performance. A three-stage SDLA test key was implemented. The measured results at 52 GHz show that the dynamic range is 50 dB and the logarithmic errors are within ±1.5 dB. From 50 to 62 GHz, the dynamic range is better than 35 dB, and the logarithmic errors are within ±2 dB. The total power consumption and chip size are 20 mW and 0.66 mm2, respectively. Compared to the previously reported millimeter-wave (MMW) power detectors, the proposed work features a wider dynamic range and reasonably linear logarithmic curve response to RF input power.

原文English
主出版物標題2017 IEEE MTT-S International Microwave Symposium, IMS 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面642-645
頁數4
ISBN(電子)9781509063604
DOIs
出版狀態Published - 2017 十月 4
事件2017 IEEE MTT-S International Microwave Symposium, IMS 2017 - Honololu, United States
持續時間: 2017 六月 42017 六月 9

出版系列

名字IEEE MTT-S International Microwave Symposium Digest
ISSN(列印)0149-645X

Other

Other2017 IEEE MTT-S International Microwave Symposium, IMS 2017
國家United States
城市Honololu
期間17-06-0417-06-09

    指紋

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

引用此

Chou, C. C., Lai, W. C., Huang, T. H., & Chuang, H. R. (2017). A low minimum detectable power, high dynamic range, V-Band CMOS millimeter-wave logarithmic power detector. 於 2017 IEEE MTT-S International Microwave Symposium, IMS 2017 (頁 642-645). [8058651] (IEEE MTT-S International Microwave Symposium Digest). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2017.8058651