A new design to prevent fault equivalence in PLA's

B. D. Liu; G. T. Shaw

A new design to prevent fault equivalence in PLA's

B. D. Liu, G. T. Shaw

電機工程學系

研究成果: Conference article › 同行評審

2 引文斯高帕斯（Scopus）

摘要

The fault equivalence problem in programmable logic arrays (PLAs) is introduced. Some design rules are proposed. Based on the pseudoexhaustive testable PLA structure, a diagnosis algorithm was developed and implemented on a SUN 3/110 workstation in C language. Experimental results show that this design and the algorithm are quite efficient for PLA fault diagnosis.

原文	English
頁（從 - 到）	2752-2755
頁數	4
期刊	Proceedings - IEEE International Symposium on Circuits and Systems
卷	4
出版狀態	Published - 1990 12月 1
事件	1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4) - New Orleans, LA, USA 持續時間: 1990 5月 1 → 1990 5月 3

All Science Journal Classification (ASJC) codes

電氣與電子工程

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引用此

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abstract = "The fault equivalence problem in programmable logic arrays (PLAs) is introduced. Some design rules are proposed. Based on the pseudoexhaustive testable PLA structure, a diagnosis algorithm was developed and implemented on a SUN 3/110 workstation in C language. Experimental results show that this design and the algorithm are quite efficient for PLA fault diagnosis.",

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AU - Shaw, G. T.

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AB - The fault equivalence problem in programmable logic arrays (PLAs) is introduced. Some design rules are proposed. Based on the pseudoexhaustive testable PLA structure, a diagnosis algorithm was developed and implemented on a SUN 3/110 workstation in C language. Experimental results show that this design and the algorithm are quite efficient for PLA fault diagnosis.

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M3 - Conference article

AN - SCOPUS:0025683464

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SP - 2752

EP - 2755

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

SN - 0271-4310

T2 - 1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4)

Y2 - 1 May 1990 through 3 May 1990

ER -

A new design to prevent fault equivalence in PLA's

摘要

All Science Journal Classification (ASJC) codes

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引用此