A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

Yao Jen Chuang; Hsin Hung Ou; Bin Da Liu

doi:10.1109/VDAT.2005.1500084

A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

Yao Jen Chuang, Hsin Hung Ou, Bin Da Liu

電機工程學系

研究成果: Conference contribution

28 引文斯高帕斯（Scopus）

摘要

A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

原文	English
主出版物標題	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
頁面	315-318
頁數	4
DOIs	https://doi.org/10.1109/VDAT.2005.1500084
出版狀態	Published - 2005
事件	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan 持續時間: 2005 4月 27 → 2005 4月 29

出版系列

名字	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
卷	2005

Other

Other	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
國家/地區	Taiwan
城市	Hsinchu
期間	05-04-27 → 05-04-29

All Science Journal Classification (ASJC) codes

工程 (全部)

存取文件

10.1109/VDAT.2005.1500084

其它文件與鏈接

引用此

Chuang, Y. J., Ou, H. H., & Liu, B. D. (2005). A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. 於 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (頁 315-318). [1500084] (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); 卷 2005). https://doi.org/10.1109/VDAT.2005.1500084

@inproceedings{c11bb0c333794ad58c2b74831f0f25fb,

title = "A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter",

abstract = "A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.",

author = "Chuang, {Yao Jen} and Ou, {Hsin Hung} and Liu, {Bin Da}",

year = "2005",

doi = "10.1109/VDAT.2005.1500084",

language = "English",

isbn = "0780390601",

series = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

pages = "315--318",

booktitle = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

note = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) ; Conference date: 27-04-2005 Through 29-04-2005",

}

Chuang, YJ, Ou, HH & Liu, BD 2005, A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. 於 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)., 1500084, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), 卷 2005, 頁 315-318, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), Hsinchu, Taiwan, 05-04-27. https://doi.org/10.1109/VDAT.2005.1500084

A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. / Chuang, Yao Jen; Ou, Hsin Hung; Liu, Bin Da.
2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT). 2005. p. 315-318 1500084 (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); 卷 2005).

研究成果: Conference contribution

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N2 - A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

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Y2 - 27 April 2005 through 29 April 2005

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A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

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