A novel method for representing industrial inspection pattern

Yung Nien Sun, Ching Tsorng Tsai

研究成果: Conference contribution

摘要

A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.

原文English
主出版物標題90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90
發行者Publ by IEEE
頁面596-600
頁數5
ISBN(列印)0879425563
出版狀態Published - 1990
事件1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90 - Hong Kong
持續時間: 1990 9月 241990 9月 27

出版系列

名字90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90

Other

Other1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90
城市Hong Kong
期間90-09-2490-09-27

All Science Journal Classification (ASJC) codes

  • 工程 (全部)

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